Power semiconductor device and its control circuit of photovoltaic grid-connected inverter is the weakest part in the photovoltaic generation system. Fault feature extraction is the key to the inverter fault diagnosis. Output voltage of inverter is the most sensitive characteristic quantity which can reflect its working status directly. The single transistor open fault diagnosis of photovoltaic grid-connected inverter can be achieved by extracting the output voltage frequency spectrum with the help of windowed STFT. The simulation results demonstrate the effectiveness of the method.