Twin boundaries in a crystalline material can be defined by a particular rotation angle about a particular access or a mirrored crystal orientation about a particular plane [1]. For example, copper twins are typically defined by a 60 rotation about where the associated twin plane is of the {111} family. One critical area of twin research looks at deformation twinning as the limiting factor for formability of Mg alloys, such as AZ31 [2]. In AZ31 there are two basic twin modes: compression twinning and tension twinning. The latter phenomenon forms fairly large, easy to detect twinned regions within parent grains, whereas the former tends to form extremely thin twins that are on the order of 100 nm wide. Additionally, the copper which is frequently seen in many microelectronics contains twins on the order of 10 nm [3]. In both cases these features are within the detectable limits for a modern scanning electron microscope (SEM). However, identifying these twins via crystal orientation relations with electron backscatter diffraction (EBSD) in the SEM relies on a larger spatial resolution which makes detecting these twins from crystallographic information difficult in the SEM. This study presents a method whereby improved spatial resolution of thin twins can be achieved with EBSD.