Unfamiliar invert host silicate glass from the system SiO2-TiO2-KF-Li2O was prepared together with SiC doped samples by traditional melt-quenching technique. Collective characterization of the prepared glasses through FTIR, optical, thermal and microhardness properties were measured to justify the effect of silicon carbide (SiC) on the resultant data. Silicon carbide is selected because its known high mechanical and thermal properties and extended applications of SiC- containing candidates in several domains. Structural FTIR characterization of the prepared glasses reveals familiar silicate network in spite of their invert percent together with the suggested sharing of Si-Ti or Ti-Ti or fluoride units. Optical spectra show only distinct UV absorption with additional small peaks at 380–420 nm in high percent of SiC. Such UV spectra are assumed to originate from unavoidable traces of ferric ions contaminated within the raw materials used for the preparation of glasses. The known high thermal and mechanical properties of silicon carbide are identified to be reflected on the measured thermal expansion and Vickers microhardness data. Samples from the parent glasses were thermally heated to produce their corresponding glass-ceramic derivatives. X-ray diffraction analysis indicate the formation of the peculiar orlovite crystalline phase as a major one due to the presence of all the constituents within the chemical composition of the invert glass. Also, some minor crystalline phases of lithium silicate or lithium titanium silicate are identified. It is assumed that the presence of self-nucleation Li2O and high negatively charged fluoride anions beside the conditional oxide of TiO2 facilitate the ease of nucleation and crystallization of the formed crystalline phase. SEM results confirm the x-ray data showing different crystalline features with the addition of SiC.