For samples with T 1s longer than 10 s, calibration of the RF probe and a measurement of T 1 can be very time-consuming. A technique is proposed for use in imaging applications where one wishes to rapidly obtain information about the RF flip angle and sample T 1 prior to imaging. The flip angle measurement time is less than 1 s for a single scan. Prior knowledge of the RF flip angle is not required for the measurement of T 1. The resulting time savings in measuring the values of flip angle and T 1 are particularly significant in the case of samples with very long T 1 and short T 2 ∗ . An imaging extension of the technique provides RF flip angle mapping without the need for incrementing the pulse duration, i.e., RF mapping can be performed at fixed RF amplifier output.