Abstract This article describes the elevation of polarized-light microscopy (PLM) to a technique for quantitative large-area material characterization in the Microscopy Today Innovation Award-winning CrystalViewTM laser PLM. CrystalView is enabled by narrow-band laser illumination, bistatic design, and strict qualification of polarization optics, resulting in accurate polarization imaging over an instant field-of-view (FOV) that exceeds 2 cm2. This FOV is effectively demonstrated by the critical concept of seamless stitching, which confirms low error and is then applied to obtain even larger effective FOVs with industrial utility. Linear combinations of image irradiances, known as polarization features, are related to physical material properties, for instance, crystal orientation, through the combination of Mueller matrix polarimeter design and classical electrodynamics. While CrystalView is applicable to any reflective or transmissive material that exhibits PLM contrast, in this article it is demonstrated for orientation imaging of hexagonal and cubic metal polycrystals, titanium and stainless-steel alloys respectively, the latter printed by laser powder-bed fusion (LPBF) and reliant, for texture imaging, on chemical etching that can also reveal phase structure.
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