Faults In Field Programmable Gate Arrays Research Articles

Efficient Error Detection for Matrix Multiplication With Systolic Arrays on FPGAs

Matrix multiplication has always been a cornerstone in computer science. In fact, linear algebra tools permeate a wide variety of applications: from weather forecasting, to financial market prediction, radio signal processing, computer vision, and more. Since many of the aforementioned applications typically impose strict performance and/or fault tolerance constraints, the demand for fast and reliable matrix multiplication (MxM) is at an all-time high. Typically, increased reliability is achieved through redundancy. However, coarse-grain duplication incurs an often prohibitive overhead, higher than 100%. Thanks to the peculiar characteristics of the MxM algorithm, more efficient algorithm-based hardening solutions have been designed to detect (and even correct) some types of errors with lower overhead. We show that, despite being more efficient, current solutions are still sub-optimal in certain scenarios, particularly when considering persistent faults in Field-Programmable Gate-Arrays (FPGAs). Based on a thorough analysis of the fault model, we propose an error detection technique for MxM that decreases both algorithmic and architectural costs by over a polynomial degree, when compared to existing algorithm-based strategies. Furthermore, we report arithmetic overheads at the application level to be under 1% for three state-of-the-art Convolutional Neural Networks (CNNs).

AM&FT: An Aging Mitigation and Fault Tolerance Framework for SRAM-Based FPGA in Space Applications

Field programmable gate arrays (FPGAs) have become very widely used devices in space applications, and their runtime reconfigurable architecture allows for the area and power acceleration for complex applications. However, FPGAs are increasingly susceptible to aging effects and failures due to harsh space environments and long operation cycles, which reduce the reliability and lifetime of such devices. Although offline aging-aware layout-based methods are effective in aging mitigation, existing studies ignore the fault tolerance needs of the task and the layout strategy will completely fail after a hard failure occurs. This paper presents a reliability framework AM&FT for SRAM-based FPGAs in space applications to support on-chip aging mitigation and fault tolerance. We use an Integer Linear Programming (ILP) model to solve mapping relationships between tasks and reconfigurable blocks (Rbs) in the offline phase to achieve the aging and reliability-aware layout strategy. Second, the ILP model is incorporated into the Design Space Exploration (DSE) to generate a set of layout strategies to tolerate hard faults. Moreover, the state model is used for runtime fault management to handle the impact of different types of faults on the device. Experimental results demonstrate that our framework achieves FPGA on-chip aging mitigation and fault tolerance. Compared with the existing methods, AM&FT can guarantee the fault tolerance requirements of tasks and give priority to guarantee the Quality of Service (QoS) of critical tasks under the condition of hard faults accumulation. In addition, our framework delivers up to [Formula: see text] mean time to failure (MTTF) than the baseline.

A High-Level Synthesis Scheduling and Binding Heuristic for FPGA Fault Tolerance

Computing systems with field-programmable gate arrays (FPGAs) often achieve fault tolerance in high-energy radiation environments via triple-modular redundancy (TMR) and configuration scrubbing. Although effective, TMR suffers from a 3x area overhead, which can be prohibitive for many embedded usage scenarios. Furthermore, this overhead is often worsened because TMR often has to be applied to existing register-transfer-level (RTL) code that designers created without considering the triplicated resource requirements. Although a designer could redesign the RTL code to reduce resources, modifying RTL schedules and resource allocations is a time-consuming and error-prone process. In this paper, we present a more transparent high-level synthesis approach that uses scheduling and binding to provide attractive tradeoffs between area, performance, and redundancy, while focusing on FPGA implementation considerations, such as resource realization costs, to produce more efficient architectures. Compared to TMR applied to existing RTL, our approach shows resource savings up to 80% with average resource savings of 34% and an average clock degradation of 6%. Compared to the previous approach, our approach shows resource savings up to 74% with average resource savings of 19% and an average heuristic execution time improvement of 96x.

Validation Techniques for Fault Emulation of SRAM-based FPGAs

A variety of fault emulation systems have been created to study the effect of single-event effects (SEEs) in static random access memory (SRAM) based field-programmable gate arrays (FPGAs). These systems are useful for augmenting radiation-hardness assurance (RHA) methodologies for verifying the effectiveness for mitigation techniques; understanding error signatures and failure modes in FPGAs; and failure rate estimation. For radiation effects researchers, it is important that these systems properly emulate how SEEs manifest in FPGAs. If the fault emulation systems does not mimic the radiation environment, the system will generate erroneous data and incorrect predictions of behavior of the FPGA in a radiation environment. Validation determines whether the emulated faults are reasonable analogs to the radiation-induced faults. In this paper we present methods for validating fault emulation systems and provide several examples of validated FPGA fault emulation systems.

Detection of Crosstalk Faults in Field Programmable Gate Arrays (FPGA)

In this work, a Built-in-Self-Test (BIST) technique has been proposed to detect crosstalk faults in FPGA and run time congestion and to provide the crosstalk aware router for FPGA. The proposed BIST circuits require less overhead as compared to earlier techniques. The proposed detector can detect any logic hazard or delay due to crosstalk. A technique has also been proposed to avoid the crosstalk by routing the path in such a way that no interference occurs between the interconnects. The proposed router has achieved better utilization of routing resource to determine the net as compared to the earlier works. The proposed scheme is simulated in MATLAB and verified using Xilinx ISE tools and Modelsim 6.0. The router is implemented by using class provided by JBits for Xilinx, Vertex-II FPGA. It has been found that the results are quite encouraging.

Ball grid array (BGA) solder joint intermittency real-time detection

This paper presents test results and specifications for SJ BIST (solder joint built-in-self-test), an innovative sensing method for detecting faults in solder-joint networks that belong to the I/O ports of field programmable gate arrays (FPGAs), especially in ball grid array packages. It is well known that fractured solder joints typically maintain sufficient electrical contact to operate correctly for long periods of time. Subsequently, the damaged joint begins to exhibit intermittent failures: the faces of a fracture separate during periods of stress, causing incorrect FPGA signals. SJ BIST detects faults at least as low as 100 Ω with zero false alarms: minimum detectable fault period is one-half the period of the FPGA clock – guaranteed detection is two clock periods. SJ BIST correctly detects and reports instances of high-resistance with no false alarms: test results are shown in this paper. Being able to detect solder-joint faults in FPGAs increases fault coverage and health management capabilities, and provides support for condition-based and reliability-centered maintenance.

Optimisation of the stress distribution in ceramic hip joint balls by implementation of biological growth

This paper presents test results and specifications for SJ BIST (solder joint built-in-self-test), an innovative sensing method for detecting faults in solder-joint networks that belong to the I/O ports of field programmable gate arrays (FPGAs), especially in ball grid array packages. It is well known that fractured solder joints typically maintain sufficient electrical contact to operate correctly for long periods of time. Subsequently, the damaged joint begins to exhibit intermittent failures: the faces of a fracture separate during periods of stress, causing incorrect FPGA signals. SJ BIST detects faults at least as low as 100 Ω with zero false alarms: minimum detectable fault period is one-half the period of the FPGA clock – guaranteed detection is two clock periods. SJ BIST correctly detects and reports instances of high-resistance with no false alarms: test results are shown in this paper. Being able to detect solder-joint faults in FPGAs increases fault coverage and health management capabilities, and provides support for condition-based and reliability-centered maintenance.

Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey

Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault diagnosis, FPGA defect tolerance, and FPGA fault tolerance. This paper provides a guided tour to the approaches related to these topics. These include techniques, which are applied to the FPGA and others which have been recently introduced and can be applied to today's FPGAs.

Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays

Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault dia...

Test and diagnosis of faulty logic blocks in FPGAs

Field programmable gate arrays (FPGAs) have been used in many areas of digital design. Because FPGAs are programmable, faults in them can be easily tolerated once fault sites are located. However, diagnosis of faults in FPGA has not yet been explored by researchers. A new methodology for the testing and diagnosis of faults in FPGAs is presented, based on built-in self-test. The proposed method imposes no hardware overhead, and requires minimal support from external test equipment. Test time depends only on the number of faults, and is independent of the chip size. With the help of this technique, chips with faults can still be used. As a result, the chip yield can be improved and chip cost is reduced. This method can also be used in fault-tolerant systems, in which a good functional circuit can still be mapped to a FPGA with faulty elements, as long as the fault sites are known.