The introduction of silver ions into glass by diffusion from an external source is of interest in modifying the optical and electrical properties of glass for device applications. Silver is introduced to fabricate in-glass waveguides, while potassium ions are introduced to pattern the silver diffusion by locally impeding the diffusion. Electric fields assist the silver diffusion, leading to faster diffusion rates of ions and allowing greater concentrations of silver without a metallic cluster formation. However, ion depletion layers are formed in the glass as a result of the application of electric field. Here, we study the nature of these depletion layers using depth profiles of composition after electric field diffusion, using cross-sectional energy dispersive x-ray spectroscopy analysis and infrared spectroscopy (Fourier transform infrared attenuated total reflection spectroscopy). We confirm the accelerated diffusion of silver by an electric field and show that potassium impedes the diffusion of silver even when a field is present. We find that an ion depletion layer is formed below the glass surface by the applied electric field which leads to a thermal relaxation and depolarization process when the samples are reheated. Observation of this process enables activation energies and threshold temperatures for the diffusion of Ag, K, and Na to be evaluated and compared with values obtained by composition profiles. Potassium was found to increase the initially low temperature threshold for silver diffusion, increase the activation energy, and also impede sodium diffusion.
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