Induction Of External Magnetic Field Research Articles

Possibility of contactless measurement of free charge carrier mobility in semiconductors by the uhf resonator method

A contactless method for measuring free charge carrier mobility in semiconductors using a uhf resonator is described. The method is based on the dependence of the Q of a quasistatic uhf resonator containing the semiconductor specimen on external magnetic field induction. Simple relationships are obtained which allow low determination of the magnetoresistive mobility from the change in Q of the external portion of the resonator under the action of a weak magnetic field.