An isolated acceptor impurity is shown to be responsible for the ∼113-meV deep luminescence band which is frequently seen in GaAs layers grown by molecular-beam epitaxy. We establish that this center, which is also observed in melt-grown and solution-grown GaAs and which has often been associated with the presence of native defects, is due to Mn. The luminescence arises from donor-acceptor and conduction-band–acceptor recombination involving holes bound at the Mn acceptor. Electron paramagnetic resonance on Mn-doped layers shows that Mn is incorporated as an isolated defect with cubic symmetry. This result, coupled with the suppression of Mn-associated luminescence and electrical activation under Ga-rich growth conditions, indicates that Mn is incorporated primarily as a substitutional acceptor on Ga sites. Hole concentrations scale with Mn source temperature in a manner consistent with arrival-rate-controlled incorporation from a Knudsen effusion source. Room-temperature hole concentrations up to the 1018-cm−3 level can be achieved while maintaining excellent surface morphology. This suggests that Mn will be a useful dopant in the growth of junction structures by molecular-beam epitaxy.