Analysis Of EXAFS Data Research Articles

Comparative study of amorphous III–V compounds

The results of EXAFS, optical and electrical measurements performed on amorphous GaAs and GaP films as a function of deposition conditions and annealing are discussed and compared. In the case of GaP, the existence of wrong bonds is suggested by the analysis of EXAFS data as well as by the behavior of the optical properties near the absorption edge and of the conductivity at high temperatures.