By irradiating undoped ZnO and Ga-doped ZnO (GZO) films with electron cyclotron resonance Ar plasma, their electrical and optical properties have been modified. Both the carrier concentration and the Hall mobility increased with continuous irradiation in conductive ZnO films with a defect-rich crystalline lattice. Improved crystallinity was verified by intensifying the ZnO(002) x-ray diffraction peak and increasing the optical transmission level in the visible wavelength. This observation suggests network rearrangement through Zn atoms at interstitials or grain boundaries being oxidized or accommodated into the crystalline network. For insulating ZnO films that contain a sufficient number of oxygen atoms, the changes were better scaled with sheet resistance rather than resistivity. The interference fringes redshifted without lowering the transmittance level. Here, Ar ion impact will create oxygen vacancy donors in the near-surface region or desorb interstitial oxygen atoms that act as donor killers. In contrast, GZO films with resistivities in the 10−4 Ω cm range revealed little changes because there were very few imperfections in the crystalline lattice. The reduced amount of resistivity corresponded to the creation of oxygen vacancies in more resistive GZO films in the 10−3 Ω cm range.
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