Multilayers of PbZr 0.52 Ti 0.48 O 3 (PZT) or SrBi2Nb 2 O 9 (SBN) ferroelectrics (F) and YBa 2 Cu 3 O 7 (YBaCuO) superconductor (S) have been grown by pulsed laser deposition. F/S or S/F bilayers as well as S/F/S trilayers deposited on SrTiO 3 and MgO were epitaxially grown, as evidenced by x-ray diffraction (XRD) in θ-2θ and (p-scans modes, reflection high energy electron diffraction (RHEED) or electron channeling patterns (ECP). Superconducting YBaCuO films deposited on PZT exhibit a critical temperature, T c , of about 86 K slightly below the value routinely obtained in the same deposition conditions on bare (100)SrTiO 3 substrate (typically 88-89 K). By contrast, the T c of YBaCuO films on SBN, either on (100)SrTiO 3 or on (100)MgO is close to 88-89 K suggesting that SBN can be a good candidate as ferroelectric buffer layer for the growth of YBaCuO, especially on MgO for which a graphoepitaxial mechanism tends to limit the YBaCuO growth quality. In the case of F/S layers, hysteresis loops of PZT on YBaCuO show a saturated polarization larger than 30 μC/cm 2 and a coercive field of about 70 kV/cm. Secondary ion mass spectrometry (SIMS) experiments have been performed in order to correlate interdiffusion mechanisms with both structural data and physical properties.