In the present paper, we discuss the results of the study of magnetic properties and micromagnetic structure of the multilayer [Co(4 × t) Å/Pt(5 × t) Å]10 thin films with varied bilayer thickness (t). The structures were fabricated by alternating electron beam evaporation of Co and Pt targets. The measurements of the element distribution profile, magnetic field dependence of magnetization, and magnetic force microscopy pictures have shown that varying the t coefficient allows for manipulating the degree Co and Pt layers intermixing, which, in turn, changes the magnetic properties of the films over a wide range. In particular, in structures representing a CoxPt1-x solid solution with a variable composition, magnetic skyrmions were revealed upon magnetization of the films. Varying the Co vs. Pt composition heterogeneity makes it possible to control the skyrmion density. The results are believed to be promising for the fabrication of skyrmion-based memory elements.
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