The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced Single-Event Effects in electronic devices. In this work we study a setup where the 200-MeV electron beam of the CLEAR accelerator at CERN is directed on an aluminum target to produce a radiation field with a large neutron component. The resulting environment is analyzed by measuring the Single-Event Upset (SEU) and Latchup rates in well-characterized SRAMs, as well as the Total Ionizing Dose in passive Radio-Photo-Luminescence dosimeters, and by comparing the results with predictions from FLUKA simulations. We find that a lateral shielding made of lead protects the SRAMs from an excessive TID rate, yielding an optimal configuration for SEU measurements, particularly in SRAMs that are highly sensitive to MeV-scale neutrons. This setup provides an interesting complementary neutron source with respect to standard neutron facilities based on spallation targets or radioactive sources.