Electrostatic shielding is an important consideration for large area field emitters (LAFEs) and results in a distribution of field enhancement factors even when the constituent emitters are identical. Ideally, the mean and variance together with the nature of the distribution should characterize a LAFE. In practice, however, it is generally characterized by an effective field enhancement factor obtained from a linear fit to a Fowler–Nordheim plot of the I−V data. An alternate characterization is proposed here based on the observation that for a dense packing of emitters, shielding is large and LAFE emission occurs largely from the periphery, while well separated emitter tips show a more uniform or two-dimensional emission. This observation naturally leads to the question of the existence of an emission dimension, De, for characterizing LAFEs. We show here that the number of patches of size LP in the ON-state (above average emission) scales as N(LP)∼LP−De in a given LAFE. The exponent De is found to depend on the applied field (or voltage) and approaches De=2 asymptotically.
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