Edge Illumination Research Articles

Inline edge illumination X-ray phase contrast imaging through mask misalignment

Inline edge illumination X-ray phase contrast imaging through mask misalignment

Recent developments in fly scan methods for phase and multi-contrast x-ray micro-CT based on amplitude modulated beams

Beam tracking and edge illumination are phase contrast imaging techniques that rely on amplitude modulated x-ray beams to generate sensitivity to refraction and scattering. While each technique has its advantage (“single shot” three-contrast imaging in beam tracking; the ability to work with relatively large pixels in edge illumination), they also share a common drawback, namely that the modulator shields parts of the sample and, thus, prevents those areas from contributing to the image (under-sampling). Sample stepping, by which frames are acquired with the sample in a different position relative to the modulator (sometimes referred to as “dithering”) can produce well-sampled images. However, in computed tomography (CT), stepping must be performed at each rotation angle, enforcing step-and-shoot acquisitions and leading to long scan times. To enable faster acquisitions, fly scan compatible scanning schemes based on “roto-translating” the sample in the modulated x-ray beam were recently developed. This article reviews these schemes and provides practical guidance for their implementation.

Phase contrast micro-CT with adjustable in-slice spatial resolution at constant magnification

Objective. To report on a micro computed tomography (micro-CT) system capable of x-ray phase contrast imaging and of increasing spatial resolution at constant magnification. Approach. The micro-CT system implements the edge illumination (EI) method, which relies on two absorbing masks with periodically spaced transmitting apertures in the beam path; these split the beam into an array of beamlets and provide sensitivity to the beamlets’ directionality, i.e. refraction. In EI, spatial resolution depends on the width of the beamlets rather than on the source/detector point spread function (PSF), meaning that resolution can be increased by decreasing the mask apertures, without changing the source/detector PSF or the magnification. Main results. We have designed a dedicated mask featuring multiple bands with differently sized apertures and used this to demonstrate that resolution is a tuneable parameter in our system, by showing that increasingly small apertures deliver increasingly detailed images. Phase contrast images of a bar pattern-based resolution phantom and a biological sample (a mouse embryo) were obtained at multiple resolutions. Significance. The new micro-CT system could find application in areas where phase contrast is already known to provide superior image quality, while the added tuneable resolution functionality could enable more sophisticated analyses in these applications, e.g. by scanning samples at multiple scales.

Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox.

Edge illumination x-ray phase contrast imaging (XPCI) provides increased contrast for low absorbing materials compared to attenuation images and sheds light on the material microstructure through dark field contrast. To apply XPCI in areas such as non-destructive testing and inline inspection, where scanned samples are increasingly compared to simulated reference images, accurate and efficient simulation software is required. However, currently available simulators rely on expensive Monte Carlo techniques or wave-optics frameworks, resulting in long simulation times. Furthermore, these simulators are often not optimized to work with computer-aided design (CAD) models, a common and memory-efficient method to represent manufactured objects, hindering their integration in an inspection pipeline. In this work, we address these shortcomings by introducing an edge illumination XPCI simulation framework built upon the recently developed CAD-ASTRA toolbox. CAD-ASTRA allows for the efficient simulation of x-ray projections from CAD models through GPU-accelerated ray tracing and supports ray refraction in a geometric optics framework. The edge illumination implementation is validated and its performance is benchmarked against GATE, a state-of-the-art Monte Carlo simulator, revealing a simulation speed increase of up to three orders of magnitude, while maintaining high accuracy in the resulting images.

Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps.

Edge illumination (EI) is an X-ray imaging technique that, in addition to conventional absorption contrast, provides refraction and scatter contrast. It relies on an absorption mask in front of the sample that splits the X-ray beam into beamlets, which hits a second absorption mask positioned in front of the detector. The sample mask is then shifted in multiple steps with respect to the detector mask, thereby measuring an illumination curve per detector element. The width, position, and area of this curve estimated with and without the sample in the beam is then compared, which ultimately provides absorption, refraction, and scatter contrast for each detector pixel. From the obtained contrast sinograms, three contrast tomograms can be computed. In summary, conventional EI relies on a two-stage process comprised of a computational and time intensive contrast retrieval process, followed by tomographic reconstruction. In this work, a novel joint reconstruction method is proposed, which utilizes a combined forward model to reconstruct the three contrasts simultaneously, without the need for an intermediate contrast retrieval step. Compared to the state-of-the-art, this approach reduces reconstruction times, as the retrieval step is skipped and allows a much more flexible acquisition scheme, as there is no need to sample a full illumination curve at each projection angle. The proposed method is shown to improve reconstruction quality on subsampled datasets, enabling the reconstruction of three contrasts from single-shot datasets.

Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study.

Edge illumination is an emerging X-ray phase contrast imaging technique providing attenuation, phase and dark field contrast. Despite the successful transition from synchrotron to lab sources, the cone beam geometry of lab systems limits the effectiveness of using conventional planar gratings. The non-parallel incidence of X-rays introduces shadowing effects, worsening with increasing cone angle. To overcome this limitation, several alternative grating designs can be considered. In this paper, the effectiveness of three alternative designs is compared to conventional gratings using numerical simulations. Improvements in flux and contrast are discussed, taking into account practical considerations concerning the implementation of the designs.

A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations.

X-ray dark field signals, measurable in many x-ray phase contrast imaging (XPCI) setups, stem from unresolvable microstructures in the scanned sample. This makes them ideally suited for the detection of certain pathologies, which correlate with changes in the microstructure of a sample. Simulations of x-ray dark field signals can aid in the design and optimization of XPCI setups, and the development of new reconstruction techniques. Current simulation tools, however, require explicit modelling of the sample microstructures according to their size and spatial distribution. This process is cumbersome, does not translate well between different samples, and considerably slows down simulations. In this work, a condensed history approach to modelling x-ray dark field effects is presented, under the assumption of an isotropic distribution of microstructures, and applied to edge illumination phase contrast simulations. It substantially simplifies the sample model, can be easily ported between samples, and is two orders of magnitude faster than conventional dark field simulations, while showing equivalent results.Clinical relevance- Dark field signal provides information on the microstructure distribution within the investigated sample, which can be applied in areas such as histology and lung x-ray imaging. Efficient simulation tools for this dark field signal aid in optimizing scanning setups, acquisition schemes and reconstruction techniques.

Fiber Orientation Estimation from X-ray Dark Field Images of Fiber Reinforced Polymers Using Constrained Spherical Deconvolution

The properties of fiber reinforced polymers are strongly related to the length and orientation of the fibers within the polymer matrix, the latter of which can be studied using X-ray computed tomography (XCT). Unfortunately, resolving individual fibers is challenging because they are small compared to the XCT voxel resolution and because of the low attenuation contrast between the fibers and the surrounding resin. To alleviate both problems, anisotropic dark field tomography via grating based interferometry (GBI) has been proposed. Here, the fiber orientations are extracted by applying a Funk-Radon transform (FRT) to the local scatter function. However, the FRT suffers from a low angular resolution, which complicates estimating fiber orientations for small fiber crossing angles. We propose constrained spherical deconvolution (CSD) as an alternative to the FRT to resolve fiber orientations. Instead of GBI, edge illumination phase contrast imaging is used because estimating fiber orientations with this technique has not yet been explored. Dark field images are generated by a Monte Carlo simulation framework. It is shown that the FRT cannot estimate the fiber orientation accurately for crossing angles smaller than 70∘, while CSD performs well down to a crossing angle of 50∘. In general, CSD outperforms the FRT in estimating fiber orientations.

Triple-Mode Resonant Backfire Feed Antenna With Nearly Equal E-/H-Plane and Inverse Taper Patterns

A design approach to triple-mode resonant feed antenna is advanced for parabolic reflector antenna system. The antenna is composed of a slit-loaded 1.5-wavelength sectorial dipole, a primary corner reflector, and an auxiliary circular reflector. The corner angle of the primary reflector can be employed to properly narrow down the H-plane half-power beam width (HPBW), while with the E-plane one rarely affected, such that equal E-/H-plane characteristic can be yielded accordingly. Unlike traditional backfire antennas, high-order resonant modes are employed to generate inverse taper radiation pattern at the high frequency band. As is numerically demonstrated and experimentally validated, the corner angle of the primary reflector can be eventually determined as 45∘. The antenna exhibits an impedance bandwidth of up to about 79.7%, and a nearly equal E-/H-plane bandwidth of up to about 29.4%. Average HPBW of about 65∘, gain up to about 8.9 dBi with fluctuation of less than 1 dB can be achieved within the equal E-/H-plane bandwidth. The inverse taper radiation pattern at the high frequency band can provide effective edge illumination and uniform aperture field distribution in parabolic reflector antenna systems.

Tilt angle filter effect on noise cancelation and structural edges detection in hydrocarbon sources in a gravitational potential field

Noise cancelation is the process done to remove out-of-range anomalies and make better edge boundaries interpretation. One of the most challenging issues in describing gravitational maps is separating the anomalies related to shallow sources from the deep ones. Furthermore, Existing noise can make it arduous to separate shallow blurred boundaries. In this study in SE Iran, gravitational surveying was carried out in shallow areas from the west of Qeshm to the Hormuz islands in a regular network with a distance of one kilometer. The range of gravitational Bouguer was -297 to -330 mGal. Modeling and determining geometrical parameters revealed five negative anomalies from salt penetration. The residual gravity was computed by deducting gravitational effects related to deep sources from measured gravitational data. Correspondingly, estimating the boundary and edge of the subsurface masses will be better than local filters, and anomalies will be highlighted with more intensity. Furthermore, three major fault systems in the Zagros basin were determined as the primary origin of activity and expansion of Hormuz salt. Sensitivity analysis was employed utilizing analytical signals and maps of tilt angle filtering, which both revealed the same satisfying results of -297 to -330 mGal. In this article, the effect of the tilt angle local phase filter on a synthetic model was accomplished through numerical coding. As a result, Total Horizontal Derivative (THDR) provides location of salt intrusion in Qeshm area; whereas the best image of salt intrusion, in terms of feature edge illumination, presented by Analytical signal of residual gravity map.

Modulation transfer function (MTF) evaluation for x-ray phase imaging system employing attenuation masks

Objective. Attenuation masks can be used in x-ray imaging systems to increase their inherent spatial resolution and/or make them sensitive to phase effects, a typical example being Edge Illumination x-ray phase contrast imaging (EI-XPCI). This work investigates the performance of a mask-based system such as EI-XPCI in terms of Modulation Transfer Function (MTF), in the absence of phase effects. Approach. Pre-sampled MTF measurements, using an edge, were performed on the same system implemented without masks, with non-skipped masks and finally with skipped masks (i.e. masks in which apertures illuminate every other pixel row/column). Results are compared to simulations and finally images of a resolution bar pattern acquired with all the above setups are presented. Main results. Compared to the detector’s inherent MTF, the non-skipped mask setup provides improved MTF results. In comparison to an ideal case where signal spill-out into neighbouring pixels is negligible, this improvement takes place only at specific frequencies of the MTF, dictated by the spatial repetition of the spill-out signal. This is limited with skipped masks, which indeed provide further MTF improvements over a larger frequency range. Experimental MTF measurements are supported through simulation and resolution bar pattern images. Significance. This work has quantified the improvement in MTF due to the use of attenuation masks and lays the foundation for how acceptance and routine quality control tests will have to be modified when systems using masks are introduced in clinical practice and how MTF results will compare to those of conventional imaging systems.

PEPI Lab: a flexible compact multi-modal setup for X-ray phase-contrast and spectral imaging

This paper presents a new flexible compact multi-modal imaging setup referred to as PEPI (Photon-counting Edge-illumination Phase-contrast imaging) Lab, which is based on the edge-illumination (EI) technique and a chromatic detector. The system enables both X-ray phase-contrast (XPCI) and spectral (XSI) imaging of samples on the centimeter scale. This work conceptually follows all the stages in its realization, from the design to the first imaging results. The setup can be operated in four different modes, i.e. photon-counting/conventional, spectral, double-mask EI, and single-mask EI, whereby the switch to any modality is fast, software controlled, and does not require any hardware modification or lengthy re-alignment procedures. The system specifications, ranging from the X-ray tube features to the mask material and aspect ratio, have been quantitatively studied and optimized through a dedicated Geant4 simulation platform, guiding the choice of the instrumentation. The realization of the imaging setup, both in terms of hardware and control software, is detailed and discussed with a focus on practical/experimental aspects. Flexibility and compactness (66 cm source-to-detector distance in EI) are ensured by dedicated motion stages, whereas spectral capabilities are enabled by the Pixirad-1/Pixie-III detector in combination with a tungsten anode X-ray source operating in the range 40–100 kVp. The stability of the system, when operated in EI, has been verified, and drifts leading to mask misalignment of less than 1 upmum have been measured over a period of 54 h. The first imaging results, one for each modality, demonstrate that the system fulfills its design requirements. Specifically, XSI tomographic images of an iodine-based phantom demonstrate the system’s quantitativeness and sensibility to concentrations in the order of a few mg/ml. Planar XPCI images of a carpenter bee specimen, both in single and double-mask modes, demonstrate that refraction sensitivity (below 0.6 upmurad in double-mask mode) is comparable with other XPCI systems based on microfocus sources. Phase CT capabilities have also been tested on a dedicated plastic phantom, where the phase channel yielded a 15-fold higher signal-to-noise ratio with respect to attenuation.

Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging

Conventional X-ray computed tomography (XCT) is a non-destructive imaging technique to visualize and inspect the internal structure of materials in 3D, where materials are distinguished solely on the basis of their attenuation coefficient. However, with more specialized X-ray phase contrast imaging methods, sensitivity to complementary contrasts can be achieved, namely phase contrast and dark field contrast. Edge illumination X-ray phase contrast imaging (EI-XPCI) is a technique that is especially suited for laboratory application, because it has no strict coherence requirements for the source. While there is a wide variety of XCTscanners available on the market, a commercial EI-XPCI scanner does not yet exist. In this work, we present the procedure of outfitting an existing XCT-scanner with components to enable EI-XPCI scans and discuss the alignment procedure of these added components. Finally, phase contrast images are shown demonstrating the successful upgrade of a conventional XCT system with edge illumination based phase contrast possibilities.

Unified Modulation Pattern Analysis (UMPA) algorithm for 1D sensitive X-ray phase contrast imaging techniques

X-ray phase contrast imaging (XPCI) techniques are sensitive to refraction (differential-phase) and small-angle X-ray scattering (dark-field) signals, not measurable with conventional absorption imaging techniques. Among XPCI techniques, edge illumination (EI), grating interferometry (GI), and speckle-based imaging (SBI) make use of wavefront markers, such as absorbing masks with periodical apertures or random diffusers, to encode refraction and dark-field signals induced by the sample. The Unified Modulated Pattern Analysis (UMPA) provides an algorithmic solution to extract the transmission, refraction, and dark-field images from EI, GI, and SBI datasets where the wavefront marker is directly resolved by the employed detection system. In its original implementation, UMPA has been designed for XPCI techniques sensitive to refractions along two axes. This work presents a modified version of the algorithm to extend its applicability to all the existing XPCI techniques that use wavefront markers with sensitivity to refraction limited along one direction (UMPA-1D). The algorithm, written in C++ and Cython and parallelized with OpenMP, enables fast reconstruction times that are particularly convenient for large tomographic datasets. The validity of the UMPA-1D has been demonstrated using both simulated images and real acquisitions with an EI setup in beam-tracking mode.

Design and manufacturing technology of ultrashort-throw projectors with freeform mirrors

Ultrashort-throw projectors allow large screens in very limited space and without concerns about shadows that obstruct the image, which is the development trend of the projector industry. However, the technical problems of image distortion and uneven illumination restrict its industrialization development. The freeform mirror is the core component of the ultrashort-throw projection system, and the high-performance design method and corresponding manufacturing technology are the key factors of ultrashort-throw projectors to achieve rapid development. In this paper, the initial shape of the freeform mirror is designed by geometric construction with energy mapping. The ultrashort-throw projection imaging system model is established. After optimization, the throw ratio is 0.2, the projection screen is 80 inches, the total length of the projection lens is 155 mm, the field of view is 152 deg, and the edge illumination of the system is 97% of the center illumination. The assembly and adjustment method of the lens and the processing and coating method of the mirror are studied, and the experimental prototype is assembled and tested. This paper aims to establish the theory of freeform surface design and provide theoretical and technical support for the construction and system design of off-axis complex freeform surface.

Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging.

In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are evaluated through a wave optics model—numerically simulated in MATLAB—and are compared based on their contrast, edge-enhancement, visibility, and dose efficiency characteristics. The EI-XPCi configuration, in general, demonstrates higher performance compared to PB-XPCi, considering a setup with the same X-ray source and detector. However, absorption masks quality (thickness of X-ray absorption material) and environmental vibration effect are two potential challenges for EI-XPCi employing a detector with micron-scale pixels. Simulation results confirm that the behavior of an EI-XPCi system employing a high-resolution detector is susceptible to its absorption masks thickness and misalignment. This work demonstrates the potential and feasibility of employing a high-resolution direct conversion detector for phase-contrast imaging applications where higher dose efficiency, higher contrast images, and a more compact imaging system are of interest.

Replacing the detector mask with a structured scintillator in edge-illumination x-ray phase contrast imaging

We present a proof-of-concept edge illumination x-ray phase contrast system where the detector mask has been replaced by an indirect conversion detector in which sensitive and insensitive regions have been obtained by “patterning” the scintillator. This was achieved by creating a free-standing grid with period and aperture size matching that of a typical detector mask and filling the apertures with gadolinium oxysulfide. Images of various samples were collected with both the modified and the original edge illumination systems based on the use of two masks to characterize the performances of this detector design. We found that, despite the proof-of-concept nature of this attempt resulting in a structured detector with suboptimal performance, it allows effective separation of the attenuation and refraction channels through phase retrieval and the visualization of hard-to-detect features such as cartilage through the latter channel, thus demonstrating that the proposed approach holds the potential to lead to improved stability since it will use a single optical element facilitating the design of rotating phase contrast systems or the retrofitting of conventional x-ray systems.

Volumetric High-Resolution X-Ray Phase-Contrast Virtual Histology of Breast Specimens With a Compact Laboratory System.

The assessment of margin involvement is a fundamental task in breast conserving surgery to prevent recurrences and reoperations. It is usually performed through histology, which makes the process time consuming and can prevent the complete volumetric analysis of large specimens. X-ray phase contrast tomography combines high resolution, sufficient penetration depth and high soft tissue contrast, and can therefore provide a potential solution to this problem. In this work, we used a high-resolution implementation of the edge illumination X-ray phase contrast tomography based on “pixel-skipping” X-ray masks and sample dithering, to provide high definition virtual slices of breast specimens. The scanner was originally designed for intra-operative applications in which short scanning times were prioritised over spatial resolution; however, thanks to the versatility of edge illumination, high-resolution capabilities can be obtained with the same system simply by swapping x-ray masks without this imposing a reduction in the available field of view. This makes possible an improved visibility of fine tissue strands, enabling a direct comparison of selected CT slices with histology, and providing a tool to identify suspect features in large specimens before slicing. Combined with our previous results on fast specimen scanning, this works paves the way for the design of a multi-resolution EI scanner providing intra-operative capabilities as well as serving as a digital pathology system.

Post-acquisition mask misalignment correction for edge illumination x-ray phase contrast imaging.

Edge illumination x-ray phase contrast imaging uses a set of apertured masks to translate phase effects into variation of detected intensity. While the system is relatively robust against misalignment, mask movement during acquisition can lead to gradient artifacts. A method has been developed to correct the images by quantifying the misalignment post-acquisition and implementing correction maps to remove the gradient artifact. Images of a woven carbon fiber composite plate containing porosity were used as examples to demonstrate the image correction process. The gradient formed during image acquisition was removed without affecting the image quality, and results were subsequently used for quantification of porosity, indicating that the gradient correction did not affect the quantitative content of the images.

Reliable material characterization at low x-ray energy through the phase-attenuation duality

We present a comparison of between two polychromatic x-ray imaging techniques used to characterize materials: dual energy (DE) attenuation and phase-attenuation (PA), the latter being implemented via a scanning-based Edge Illumination system. The system-independent method to extract electron density and effective atomic number developed by Azevedo et al. IEEE Trans. Nucl. Sci. 63, 341 (2016)—SIRZ—is employed for the analysis of planar images, with the same methodology being used for both approaches. We show PA to be more reliable at low energy x-ray spectra (40 kVp), where conventional DE breaks down due to insufficient separation of the energies used in measurements, and to produce results comparable with “standard” DE implemented at high energy (120 kVp), therefore, offering a valuable alternative in applications where the use of high x-ray energy is impractical.