Sn-based solders are known for their tendency to form coarse grained microstructures. In combination with the high elastic anisotropy of β-Sn, the overall elastic properties and their interpretation require a careful discussion of the structure–property-relationship as elastic constants are often important input parameters for creep or fatigue models. This study therefore investigates the influence of microstructure and testing method on the Young’s modulus E for the widespread lead free solder alloy Sn-Ag3.8-Cu0.7 (SAC387) using bulk specimens. Due to its already high homologous temperature at room temperature (Thom≈ 0.6 = T/Tm for Tm being the melting temperature), hot tensile tests generally bear the risk of superimposed creep deformation. Mechanical testing becomes even more challenging, since yield strengths are usually low for these alloys. Consequently, in addition to the hot tensile tests executed for the engineering strain rate ϵ̇e=1⋅10−3 s−1, two supplemental methods are used to determine the Young’s modulus comprising of the dynamic resonance frequency measurement and the calculation of the Young’s modulus based on single crystal compliance data of the majority phase β-Sn.Young’s moduli yielded from dynamic resonance frequency measurement and calculations based on single crystal compliance data showed comparable results of (E35 °C≈ 55 GPa, E80 °C≈ 51 GPa and E125 °C≈ 48 GPa). Hot tensile tests showed similar data with the largest deviation at 80 °C, where E80 °C≈ 53 GPa was determined. These absolute values and their temperature dependence can be attributed to the microstructure of the cast specimens which show a general preferred orientation of β-Sn grains close to <110> after analysis via electron backscattered diffraction (EBSD). A comparison with literature data revealed significant differences in the Young’s moduli which are likely to be attributed to differences in the preferred orientation of β-Sn grains.