The flash-evaporation method was used to deposit several thin films (1, 1.2, and 1.35 µm thick) of undoped lead iodide on glass slides held at $$150$$ °C and $$200$$ °C. Their X-ray diffraction patterns, scanning electron microscope micrographs, and energy-dispersive spectroscopy spectra revealed crystalline hexagonal 2H-polytypic structure and high stoichiometry ( $${\text{PbI}}_{x} ;x \cong 1.9$$ ). Their as-measured normal-incidence transmittance $$T_{\text{exp}} (\lambda)$$ –wavelength $$\lambda$$ curves exhibited above a specific wavelength $$\lambda_{{\text{c}}} \approx 520{\text{ nm}}$$ and many well-resolved interference-fringe maxima and minima, indicating good film uniformity. Below $$\lambda_{{\text{c}}}$$ , these $$T_{\text{exp}} (\lambda) - \lambda$$ curves declined sharply toward $$T_{\text{exp}} (\lambda) \cong 0$$ , signifying high film crystallinity. The $$\lambda$$ dependency of optical constants $$n(\lambda)$$ and $$\kappa (\lambda)$$ retrieved from numeric iterative curve fitting of $$T_{\text{exp}} (\lambda) - \lambda$$ data to theoretical $$T_{{{\text{theor}}}} (\lambda)$$ formula describe an air-supported {film/substrate} structure, combined with O’Leary–Johnson–Lim (OJL) interband transition dispersion model and a set of harmonic-like oscillator dispersion formulas. The retrieved bandgap energy $$E_{{\text{g}}}^{{{\text{opt}}}}$$ and band-tail breadth $$\gamma$$ were around $$2.4\,{\text{ eV}}$$ and $$100\,{\text{ meV}}$$ , respectively. The determined $$n(\lambda) - \lambda$$ data gave best curve fits to the Wemple–DiDomenico (WDD) equation with reasonable bandgap energy parameter $$E_{{\text{o}}} \cong 3.8\,{\text{ eV}} \cong 1.6\,E_{{\text{g}}}^{{{\text{opt}}}}$$ , single-oscillator energy strength $$E_{{\text{d}}} \cong 18\,{\text{ eV}}$$ and static index of refraction $$n_{{\text{o}}} \cong 2.4$$ . The calculated optical absorption coefficient $$\alpha (\lambda) = 4{\uppi }\kappa (\lambda)/\lambda$$ was found to obey the direct interband transition with bandgap energy $$E_{{\text{g}}} \cong 2.45\,{\text{ eV}}$$ in the absorption edge region, near which the curve fits of $$\alpha (\lambda)$$ to Urbach formula gave an Urbach tail parameter $${\Gamma }_{{\text{U}}}$$ of $$45\,{\text{ meV}}$$ , consistent with the results of numerical analysis of $$T_{\text{exp}} (\lambda) - \lambda$$ curves. The film thickness and substrate temperature had a slight effect on the determined optical parameters.