Discrete Mode Matching Research Articles

Efficient Analysis of Inhomogeneous Dielectric Waveguides With Dielectric Strips and Microstrips Using Discrete Mode Matching Method

In this article, the discrete mode matching (DMM) method is extended to characterize multilayered transmission line structures with inhomogeneous anisotropic dielectric layers using only 1-D discretization. We have thoroughly discussed the procedure to analyze hybrid dielectric waveguides with dielectric strips and/or microstrips, i.e., metallization at the interfaces. The analysis of the structures is based on the full-wave equivalent circuit approach, which gives the generalized relation of the field components of the multilayered structure and the corresponding system equation. Accurate results are obtained with very less computational effort. The dispersion curves and the electric field intensity distributions are presented for various dielectric waveguides and validated with the commercial software.

Analysis of Elliptical Waveguides With Anisotropic Dielectric Layers

Our main objective is to extend the discrete mode matching (DMM) method to analyze multilayered elliptical fibers or transmission lines with elliptical dielectric layers. We generate the formulation for the full-wave equivalent circuit (FWEC) and derive the hybrid matrix elements for the dielectric layers in an elliptical coordinate system and then obtain the system equation of the structure. To demonstrate the technique, we analyze elliptical waveguides and compare the results with the data obtained by other authors and by commercial software.

Multilayered Transmission Lines on Quasi-planar Substrates With Anisotropic Medium

Abstract. This paper exhibits the extension of the discrete mode matching (DMM) method to analyze conformal structures with anisotropy. It represents a simple formalism as a basis to analyze multilayered structures with quasi-planar anisotropic dielectric layers. The dyadic Green's function is then calculated using a full-wave equivalent circuit (FWEC) of the structure, where each layer is represented with the hybrid block consisting of the tangential field components. The application is demonstrated by computing propagation constants for partially filled quasi-planar waveguides and microstrip lines with isotropic, uniaxial and biaxial anisotropic dielectrics.

Analysis of Circular and Noncircular Waveguides and Striplines With Multilayered Uniaxial Anisotropic Medium

A simple procedure to analyze multilayered transmission lines with circular or quasi-circular uniaxial anisotropic dielectric layers is presented. It is based on an extension of the discrete mode matching method to analyze conformal structures with anisotropy. A generalized relation of the field components, which can be represented by a full-wave hybrid matrix for each layer, is used and then the dyadic Green's function is obtained using a full-wave equivalent circuit of the structure. The application is demonstrated by computing dispersion characteristics for graded-index optical fibers, elliptical waveguides, and elliptical stripline structures with uniaxial anisotropic dielectric.

Analysis of Conformal Microstrip Antennas With the Discrete Mode Matching Method

An extension of the discrete mode matching (DMM) method is used to analyze microstrip antennas conformed to cylinders. The structure needs to be discretized only along the azimuthal and the axial directions by sampling the fields and current densities in the interfaces between dielectric layers. The solution in the radial direction is obtained analytically with the dyadic Green's function, which is calculated using the full-wave equivalent circuit (FWEC) in the spectral domain. The structure is truncated in the axial direction by employing absorbing boundary conditions (ABCs). The mathematical formulation is given in this paper, followed by its application to compute the main properties of conformal microstrip antennas, such as resonant frequency, radiation patterns and input impedance. Validation with the commercial software HFSS has been done and good agreement between the results has been observed.

Fast analysis of cylindrical microstrip lines printed on substrates composed of multiple layers

This letter presents an analysis of microstrip lines that are printed on substrates composed of numerous dielectric layers using a fast technique that comprises the full-wave equivalent circuit and the discrete mode matching method. The validation of the proposed formulation has been done with a commercial package based on the finite-element method and very good agreement has been obtained. As a special application of our technique, we consider the analysis of microstrip lines printed on substrates with dielectric constants that vary according to given graded-index profiles. The profiles are modelled by replacing the substrate by numerous homogeneous dielectric layers. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52: 1626–1628, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25276

The Application of the Discrete Mode Matching Method to Noncircular Dielectric Waveguides

This letter presents an extension of the discrete mode matching method to the analysis of dielectric waveguides with noncircular cross sections. The problem is analyzed in cylindrical coordinates expanding the fields in terms of Bessel functions. Matching of the fields tangential to the interfaces between different dielectric layers is ensured by applying the proper boundary conditions. The mathematical formulation is given in this letter, followed by its application to compute the propagation constants in elliptical dielectric waveguides.

Analysis of cylindrical microstrip lines using the discrete mode matching method

This letter presents an extension of the discrete mode matching (DMM) method to analyze microstrip lines conformed on cylinders. The DMM is well suited to the analysis of multilayered structures, since the fields must be only sampled at the interfaces between the dielectric layers. For the case of cylindrical microstrip lines, the structure is discretized only along one direction, whereas the analytical solution is obtained in the other with the Green's functions calculated using a full-wave equivalent circuit. The mathematical formulation of the present extension is given in this letter, followed by its application to compute the propagation constants for cylindrical microstrip lines

Full-Wave analysis of microstrip lines with variable thickness substrates using the method of lines

In this paper, we present a full-wave analysis of microstrip lines printed on variable thickness substrates using the method of lines (MoL). The propagation constant of a microstrip line in the interface of one dielectric is computed as a function of different shape characteristics. The results are compared with those obtained in previous research, especially with those using the discrete mode matching technique (DMM). Good agreement is found between the results. Furthermore, the convergence behavior of the method of lines is examined and finally, we show some numerical results, obtained with analyzing this structure in a large band of frequencies.

Applying the method of lines and discrete mode‐matching method to non‐planar structures

AbstractThe method of lines (MoL) and discrete mode‐matching (DMM) method were originally applied to problems with separable boundaries and lateral homogeneity (for instance, layered planar structures). Since then, these methods have been directly applied to structures with non‐separable boundaries and/or lateral inhomogeneity. Although these extensions can be justified in certain approximate cases, there has not been sufficient discussion on its mathematical foundation. This paper discusses the above extensions and shows that the direct application of these methods to general problems may lead to inaccurate and even incongruous results. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 37: 79–83, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10830

Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure, As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.