Abstract
In this article, the discrete mode matching (DMM) method is extended to characterize multilayered transmission line structures with inhomogeneous anisotropic dielectric layers using only 1-D discretization. We have thoroughly discussed the procedure to analyze hybrid dielectric waveguides with dielectric strips and/or microstrips, i.e., metallization at the interfaces. The analysis of the structures is based on the full-wave equivalent circuit approach, which gives the generalized relation of the field components of the multilayered structure and the corresponding system equation. Accurate results are obtained with very less computational effort. The dispersion curves and the electric field intensity distributions are presented for various dielectric waveguides and validated with the commercial software.
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