Abstract
The aim of this paper is to present the extension of the discrete mode matching (DMM) method to analyze multilayered microwave structures with inhomogeneous dielectric layers. The structures with lossy and/or anisotropic (both electric and magnetic) material are taken into consideration. The procedure involves the use of a full-wave equivalent circuit to obtain the system equation. The mathematical formulation is presented, and its application is demonstrated by analyzing various waveguide structures. The validation has been done with open literature and good agreement has been observed between the results.
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