Abstract Cyclotron resonance (CR) is a standard but emerging technique for investigating carrier properties of semiconductors. We have succeeded in CR measurements by employing a microwave cavity designed for electron paramagnetic resonance (EPR). Here, we demonstrate CR imaging to visualize the spatial distribution of carriers at cryogenic temperatures for the first time. To realize CR imaging, it is necessary to account for the electric field modification in the microwave cavity of a cylindrical TM110 mode, which is designed for EPR imaging and is inherently unsuitable for CR measurements. CR detection requires the oscillating electric field perpendicular to the external static magnetic field (B0) at the sample position, which is not designed for the unloaded cavity. It has been challenging to verify the electric field distribution inside the cavity experimentally, but we show that the observation of the CR signals provides evidence of modification in the electric field. Analysis of the electromagnetic field explains the results, revealing a field distribution whose strength and direction are perturbed due to the lensing effect by the inserted dielectric materials.