In this work amine functionalized core-shell CCTO silica NPs (CCTO@SiO2-NH2) have been designed with dielectric gradients. CCTO@SiO2-NH2 core-shell NPs consist of CCTO as core (dia. 100-300 nm), and aminated silica as a shell of thickness from 5 nm - 20 nm. CCTO@SiO2-NH2 core/shell NPs were characterized with suitable characterization tools and the dielectric bahaviours were measured through impedance measurement. The dielectric study has shown significantly high dielectric properties at sintered temperature 1000°C (6 h). Further, with the increase in the shell thickness of coated SiO2-NH2 on CCTO core, the dielectric constant ε′, as well as the dielectric loss ε″ values decreased at respective frequencies, ranges between 20 Hz and 2 MHz and vice versa. The study also suggests that at the lowest frequency of 20 Hz, CCTO@SiO2 NPs with a thickness of ~5 nm shows a relatively high ε′ 1.390 × 103 whereas of ~20 nm shell thickness shows a ε′ value of 1.39 × 102. However, with a change in the thickness of SiO2 shell, the values of ε′ and ε″ varied with a regular trend (2 Hz to 20 MHz). The thinner and thicker coated SiO2 on CCTO NPs exhibited ε″ of (2.7 × 102, 13) and (73, a negative value of -26) at 1 kHz and 2 MHz, respectively. Thus the values of ε′ as a function of frequency for CCTO@SiO2-NH2 core/shell NPs at different temperature range between RT to 250°C signifies the high ε′ 1.2 × 104 for least coating and when coated sample undergoes heat treatment, it leads to the removal of some organic group before 150°C which contributes to the increase of ε′ due to the property showing by CCTO surface towards the externally applied field. Finally, it can conclude that this series of CCTO@SiO2-NH2 with a different dielectric constant can be used for designing various electronic devices.