Collective investigations on the electrical resistivity, complex dielectric permittivity, complex impedance, conductivity, and electric modulus properties of La0.55Ca0.45Mn0.8Nb0.2O3 (LCMNO) are conducted. The impedance spectroscopy (IS) technique is reviewed to examine the electrical and dielectric responses of the material according to the carrier displacement, including core-shell structure, grain boundary effects, dielectric relaxation (local relaxation), and long-range conduction (non-local relaxation). This technique can correlate the electrical and dielectric responses with the ceramics’ microstructural effects (grain boundary and grain (core-shell) zones). For LCMNO, the electrical resistivity study confirms the presence of a metal-semiconductor transition at TM-SC=66 K. It points towards a gradual crossover from the thermally activated Small Polaron Hopping (SPH) to the Variable Range Hopping (VRH) process at low temperatures and for T> TM-SC. The dielectric results confirm the presence of various types of polarization effects. The occurrence of a dipolar reorientation is attributed to long-range electrical conduction. In addition, the accumulation of the activated charge carriers increases the Maxwell-Wagner polarization resulting from an internal barrier layer capacitor (IBLC) microstructure. The electric modulus study confirms the existence of a correlation between the mobile charge carrier’s motions. From the complex impedance, dielectric, and electric modulus, it is possible to label a material’s conductive and dielectric natures (non-Debye-relaxation-type).
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