Layered Oxides such as NCM111 are state-of-the-art cathode active materials (CAMs) for commercial applications as well as promising candidates for even higher energy density batteries by raising the nickel content up to 80% (NCM811) and beyond.1 However, recent studies2–4 have demonstrated the high reactivity of Ni-rich CAMs with CO2 and moisture, which is highly problematic for industrial electrode manufacturing processes. In addition, the electrochemical performance of NCM811 is drastically deteriorated by CO2 and moisture induced surface contamination.5 We present an in-depth surface analysis by X-ray photoelectron spectroscopy (XPS) and diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) of NCM based cathode materials before and after exposure to CO2-containing atmospheres with high relative humidity. In addition, we study the extent of surface contamination by performing thermogravimetric analysis coupled with mass spectrometry (TGA-MS). The impact on cell performance is revealed by gassing analysis via on-line electrochemical mass spectrometry (OEMS) and full-cell cycling tests. The impact of the Ni content on the surface contamination of NCM type CAMs as well as the role of the Brunauer-Emmet-Teller (BET) surface area will be elucidated. A possible strategy to mitigate the reactivity of CAM surfaces with CO2 and H2O might be the chemical modification of active material surfaces using analogous approaches to those proposed in the literature.6–8 The effectiveness of such surface treatments to prevent surface contamination will be evaluated. Acknowledgements: This work is financially supported by the BASF SE Battery Research Network. References G. E. Blomgren, J. Electrochem. Soc., 164, A5019–A5025 (2017).I. A. Shkrob, J. A. Gilbert, P. J. Phillips, R. Klie, R. T. Haasch, J. Bareño and D. P. Abraham, J. Electrochem. Soc., 164, A1489–A1498 (2017)S. E. Renfrew and B. D. McCloskey, J. Am. Chem. Soc., 139, 17853-17860 (2017).N. V. Faenza, L. Bruce, Z. W. Lebens-Higgins, I. Plitz, N. Pereira, L. F. J. Piper and G. G. Amatucci, J. Electrochem. Soc., 164, A3727–A3741 (2017).R. Jung, R. Morasch, P. Karayaylali, K. Phillips, F. Maglia, C. Stinner, Y. Shao-Horn and H. A. Gasteiger, J. Electrochem. Soc., 165, A132–A141 (2018).J. Choi, J. Kim, K.-T. Lee, J. Lim, J. Lee and Y. S. Yun, Adv. Mater. Interfaces, 3, 4–9 (2016).E. M. Erickson, H. Sclar, F. Schipper, J. Liu, R. Tian, C. Ghanty, L. Burstein, N. Leifer, J. Grinblat, M. Talianker, J. S. Shin, J. K. Lampert, B. Markovsky, A. I. Frenkel and D. Aurbach, Adv. Energy Mater., 7, 1700708 1-10 (2017).Y. Su, S. Cui, Z. Zhuo, W. Yang, X. Wang and F. Pan, ACS Appl. Mater. Interfaces, 7, 25105–25112 (2015).
Read full abstract