Beryllium has a low secondary electron (SE) coefficient that produces a low signal-to-noise ratio, and in the past, this deficiency caused many workers to routinely coat beryllium with a high-Z material such as Au/Pd and examine the specimens at high voltage (HV). In principle, beryllium should be an ideal candidate for improved imaging with low voltage (LV), because its low atomic number permits excessive electron-beam penetration during HVSEM imaging — the use of LVSEM to analyze beryllium films was demonstrated previously. Unfortunately, low SE emission can seriously compromise LVSEM images from uncoated beryllium specimens, even with the improved LVSEM imaging capability of a SEM equipped with a field-emission gun (FESEM). This work demonstrates that some beryllium structures yield improved results with LVSEM imaging in a FESEM, particularly at low magnifications, while structures that require high magnification often yield better results with HVSEM.Specimens selected for this study include craters formed by a Cs+ ion beam in specimens that had been analyzed in an ion microanalyzer by secondary-ion mass spectroscopy (SIMS), machined surfaces, and fracture surfaces. SE images were obtained for this study with a Hitachi S-800 FESEM equipped with a cryogenic vacuum pumping system.Surface structure in a sputtered SIMS crater is shown at 2.0 kV in Fig. 1a and at 20 kV in Fig. 1b. This specimen was from commercial grade beryllium sheet. Prominent microtwins are visible in several grains in Fig. 1, and because of the excessive beam penetration at HV, the microtwins are better defined at LV in Fig. 1a than they are at HV in Fig. 1b. In addition, a fine faceted microstructure was formed by the ion beam that could be observed at intermediate magnifications, and it also was better defined at LV than at HV. The dark contamination film that is visible around some of the particles in Fig. 1a also is significant; this film was not apparent at voltages of 5 kV and higher, as demonstrated in Fig. 1b. SIMS ion images revealed that this material contained particles of several different compositions including carbides; since beryllium carbide hydrolyzes when exposed to moist air, the films are suspected to have formed by the decomposition of carbides when the specimen was removed from the ion microanalyzer after the SIMS analysis. This example demonstrates the excellent sensitivity of LVSEM to detect thin films, and it also suggests that contamination and the thin oxide film that forms on beryllium may impair SE imaging.