ABSTRACT The susceptibility of 28 nm static random access memory (SRAM)-based field programmable gate arrays (FPGAs) to soft errors was evaluated using alpha particles and atmospheric neutrons at the China Spallation Neutron Source (CSNS). A single event effect (SEE) test system was established to assess the sensitivity of various FPGA modules, including the configuration RAM (CRAM), block RAM (BRAM), configurable logic module (CLM), and arithmetic processing module (APM), utilizing both dynamic and static methods. The SEE error types for different sensitive modules were identified, and the SEE cross sections were calculated. The findings of this study can serve as a useful theoretical foundation for the design of radiation-hardened FPGA to enhance their reliability in radiation-prone environments.
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