The secondary copper sulphide mineral, chalcocite, is the second most important copper mineral and its flotation is significantly affected by the surface oxidation. There is scarcity of reports on sulphidisation of oxidised chalcocite and literature suggests that the conventional sulphidisation experiences difficulties in activating sulphides that are prone to oxidation. Thus the objective of this study was to understand the sulphidisation of chalcocite, the copper sulphide most prone to surface oxidation. To achieve this, surface analysis by Cryogenic X-ray photoelectron spectroscopy, Cyclic Voltammetry measurements and flotation tests were adopted. It was found that the lower flotation recovery of the oxidised chalcocite after sulphidisation at 0.10 V vs. standard hydrogen electrode was attributed to partial sulphidisation, 36.2%, of the Cu(II) oxidation species to form the desired Cu(I)-S product, while 62.8% of the species remained unsulphidised. It was revealed that all the Cu(II) oxidation species on chalcocite were sulphidised to the desired Cu(I)-S product at the lower potential of −0.20 V. Intriguingly, the flotation recovery was even lower than that obtained at 0.10 V. The limited improvement in flotation even though the surface was fully sulphidised was attributed to the high electrochemical activity and re-oxidation of the Cu(I)-S product formed.