The dielectric properties of stearic acid multilayers (SAMs) have been the subject of extensive studies, mainly on account of the ease with which samples may be prepared with thickness controlled in multiples from a monolayer of thickness 2.5 nm to 15 or more layers. In addition, SAMs provide an excellent vehicle for the study of charge injection, both in terms of markedly non-linear transport in steady high electric fields and in the much less well-understood area of charge carrier contribution to the real and imaginary components of the dielectric permittivity. The principal difficulty in the evaluation of the dielectric properties of SAMs arises from the need to deposit samples of electrical quality onto oxidized surfaces—typically aluminium— with a resulting uncertainty about the effect of the thermal alumina film on the measured response. In the present paper we report measurements on thermal alumina films between aluminium electrodes prepared under conditions analogous to those employed in the preparation of SAMs. We also describe measurements on SAMs deposited on tin base electrodes with their conducting oxide layer. In the light of these data we are able to evaluate the properties of a large number of SAMs on aluminium and tin substrates and with aluminium and gold top electrodes at various temperatures and for a range of electric fields. A novel technique of plotting the incremental values of the real and imaginary components of the susceptibility is introduced and shows clearly the influence of temperature and of high fields on the dielectric properties of multilayers.