Contact Resistance In Organic Transistors Research Articles

Ultralow contact resistance in organic transistors via orbital hybridization

Organic field-effect transistors (OFETs) are of interest in unconventional form of electronics. However, high-performance OFETs are currently contact-limited, which represent a major challenge toward operation in the gigahertz regime. Here, we realize ultralow total contact resistance (Rc) down to 14.0 Ω ∙ cm in C10-DNTT OFETs by using transferred platinum (Pt) as contact. We observe evidence of Pt-catalyzed dehydrogenation of side alkyl chains which effectively reduces the metal-semiconductor van der Waals gap and promotes orbital hybridization. We report the ultrahigh performance OFETs, including hole mobility of 18 cm2 V−1 s−1, saturation current of 28.8 μA/μm, subthreshold swing of 60 mV/dec, and intrinsic cutoff frequency of 0.36 GHz. We further develop resist-free transfer and patterning strategies to fabricate large-area OFET arrays, showing 100% yield and excellent variability in the transistor metrics. As alkyl chains widely exist in conjugated molecules and polymers, our strategy can potentially enhance the performance of a broad range of organic optoelectronic devices.

Key factors affecting contact resistance in coplanar organic thin-film transistors

We present a comprehensive numerical analysis of contact resistance in coplanar organic thin-film transistors. A large number of hole-transporting organic transistors are investigated through two-dimensional finite-element simulation, by deliberately changing the channel length, source/drain electrode thickness, and hole-injection energy barrier heights. Gate-field-dependent terminal contact resistances of these devices are fully estimated and electrostatic distributions inside the organic semiconductor film are visualized for the understanding of physical mechanisms. It is found that the relationship between source/drain electrode thickness and contact resistance does not follow any simple trend and is also strongly associated with the injection energy barrier. Moreover, the origin of negative contact resistance in organic transistors featuring a minimal charge-injection barrier is elaborated. Finally, a direct impact of the semiconductor charge-carrier mobility on contact resistance is addressed, revealing a linear dependence of contact resistance on inverse mobility over a broad parameter range.

A Critical Outlook for the Pursuit of Lower Contact Resistance in Organic Transistors.

To take full advantage of recent and anticipated improvements in the performance of organic semiconductors employed in organic transistors, the high contact resistance arising at the interfaces between the organic semiconductor and the source and drain contacts must be reduced significantly. To date, only a small portion of the accumulated research on organic thin-film transistors (TFTs) has reported channel-width-normalized contact resistances below 100 Ωcm, well above what is regularly demonstrated in transistors based on inorganic semiconductors. A closer look at these cases and the relevant literature strongly suggests that the most significant factor leading to the lowest contact resistances in organic TFTs so far has been the control of the thin-film morphology of the organic semiconductor. By contrast, approaches aimed at increasing the charge-carrier density and/or reducing the intrinsic Schottky barrier height have so far played a relatively minor role in achieving the lowest contact resistances. Herein, the possible explanations for these observations are explored, including the prevalence of Fermi-level pinning and the difficulties in forming optimized interfaces with organic semiconductors. An overview of the research on these topics is provided, and potential device-engineering solutions are discussed based on recent advancements in the theoretical and experimental work on both organic and inorganic semiconductors.

Contact resistance in organic transistors: Use it or remove it

The contact resistance of organic field-effect transistors is revisited to address its fundamental origin, parametric interplays, and technological implications. In a time when flexible electronics powered by an organic circuit comes close to the market, the revelation of wide-spread carrier mobility overestimation has astonished the broad scientific community, as this may contradict some of the most significant developments made to date. Since the contact resistance was pointed out as the major reason behind the issue, the research into reducing or eliminating this resistance has become more intense and justified than ever. However, there have been other revelations that suggest the benefits of contact resistance in certain structures and applications. Therefore, it seems timely to fairly judge the true meaning and consequences of the contact resistance, and to provide a comprehensive view covering both its positive and negative aspects, which constitutes the main motivation of this article. To maximize the depth of discussion, several important backgrounds for contact effects will be recapitulated before tackling selected practical problems of contact resistance, and before clarifying when it should actually be minimized and when it could otherwise serve as a useful element.

A simple and robust approach to reducing contact resistance in organic transistors

Efficient injection of charge carriers from the contacts into the semiconductor layer is crucial for achieving high-performance organic devices. The potential drop necessary to accomplish this process yields a resistance associated with the contacts, namely the contact resistance. A large contact resistance can limit the operation of devices and even lead to inaccuracies in the extraction of the device parameters. Here, we demonstrate a simple and efficient strategy for reducing the contact resistance in organic thin-film transistors by more than an order of magnitude by creating high work function domains at the surface of the injecting electrodes to promote channels of enhanced injection. We find that the method is effective for both organic small molecule and polymer semiconductors, where we achieved a contact resistance as low as 200 Ωcm and device charge carrier mobilities as high as 20 cm2V−1s−1, independent of the applied gate voltage.

Contact resistance in organic transistors that use source and drain electrodes formed by soft contact lamination

Soft contact lamination of source/drain electrodes supported by gold-coated high-resolution rubber stamps against organic semiconductor films can yield high-performance organic transistors. This article presents a detailed study of the electrical properties of these devices, with an emphasis on the nature of the laminated contacts with the p- and n-type semiconductors pentacene and copper hexadecafluorophthalocyanine, respectively. The analysis uses models developed for characterizing amorphous silicon transistors. The results demonstrate that the parasitic resistances related to the laminated contacts and their coupling to the transistor channel are considerably lower than those associated with conventional contacts formed by evaporation of gold electrodes directly on top of the organic semiconductors. These and other attractive features of transistors built by soft contact lamination suggest that they may be important for basic and applied studies in plastic electronics and nanoelectronic systems based on unconventional materials.