Compound Refractive Lenses Research Articles

Wavefront analysis and phase correctors design using SHADOW.

Knife-edge imaging is a successful method for determining the wavefront distortion of focusing optics such as Kirkpatrick-Baez mirrors or compound refractive lenses. In this study, the wavefront error of an imperfect elliptical mirror is predicted by developing a knife-edge program using the SHADOW/OASYS platform. It is shown that the focusing optics can be aligned perfectly by minimizing the parabolic and cubic coefficients of the wavefront error. The residual wavefront error provides precise information about the figure/height errors of the focusing optics suggesting it as an accurate method for in situ optical metrology. A Python program is developed to design a customized wavefront refractive corrector to minimize the residual wavefront error. Uniform beam at and out of focus and higher peak intensity are achieved by the wavefront correction in comparison with ideal focusing. The developed code provides a quick way for wavefront error analysis and corrector design for non-ideal optics especially for the new-generation diffraction-limited sources, and saves considerable experimental time and effort.

Opportunities and new developments for the study of surfaces and interfaces in soft condensed matter at the SIRIUS beamline of Synchrotron SOLEIL.

The SIRIUS beamline of Synchrotron SOLEIL is dedicated to X-ray scattering and spectroscopy of surfaces and interfaces, covering the tender to mid-hard X-ray range (1.1-13 keV). The beamline has hosted a wide range of experiments in the field of soft interfaces and beyond, providing various grazing-incidence techniques such as diffraction and wide-angle scattering (GIXD/GIWAXS), small-angle scattering (GISAXS) and X-ray fluorescence in total reflection (TXRF). SIRIUS also offers specific sample environments tailored for in situ complementary experiments on solid and liquid surfaces. Recently, the beamline has added compound refractive lenses associated with a transfocator, allowing for the X-ray beam to be focused down to 10 µm × 10 µm while maintaining a reasonable flux on the sample. This new feature opens up new possibilities for faster GIXD measurements at the liquid-air interface and for measurements on samples with narrow geometries.

X-ray Transfocators: Tunable X-Ray Focusing Apparatus Based on Compound Refractive Lenses

X-ray Transfocators: Tunable X-Ray Focusing Apparatus Based on Compound Refractive Lenses

Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses

Submicron Focusing of X-rays by Silicon Planar Compound Refractive Lenses

High-energy interference-free K-lines synchrotron X-ray fluorescence microscopy of rare earth elements in hyperaccumulator plants.

Synchrotron-based micro-X-ray fluorescence analysis (µXRF) is a non-destructive and highly sensitive technique. However, element mapping of rare earth elements (REEs) under standard conditions requires care, since energy-dispersive detectors are not able to differentiate accurately between REEs L-shell X-ray emission lines overlapping with K-shell X-ray emission lines of common transition elements of high concentrations. We aim to test REE element mapping with high-energy interference-free excitation of the REE K-lines on hyperaccumulator plant tissues and compare with measurements with REE L-shell excitation at the microprobe experiment of beamline P06 (PETRA III, DESY). A combination of compound refractive lens optics (CRLs) was used to obtain a micrometre sized focussed incident beam with an energy of 44 keV and an extra-thick silicon drift detector (SDD) optimised for high-energy X-ray detection to detect the K-lines of yttrium (Y), lanthanum (La), cerium (Ce), praseodymium (Pr) and neodymium (Nd) without any interferences due to line overlaps. High-energy excitation from La to Nd in the hyperaccumulator organs was successful but compared to L-line excitation less efficient and therefore slow (∼10-fold slower than similar maps at lower incident energy) due to lower flux and detection efficiency. However, REE K-lines do not suffer significantly from self-absorption, which makes XRF-tomography of millimetre-sized frozen-hydrated plant samples possible. The K-line excitation of REEs at the P06 CRL setup has scope for application in samples that are particularly prone to REE interfering elements, such as soil samples with high concomitant Ti, Cr, Fe, Mn, Ni concentrations.

Apochromatic X-ray focusing

Achromatic doublets are combinations of two individual lenses designed to focus different wavelengths of light in the same position. Apochromatic optics are improved versions of the achromatic schemes which extend the wavelength range significantly. Both achromatic and apochromatic optics are well-established for visible light. However, X-ray achromatic lenses did not exist until very recently, and X-ray apochromatic lenses have never been experimentally demonstrated. Here, we create an X-ray apochromatic lens system using an appropriate combination of a Fresnel zone plate and a diverging compound refractive lens with a tuned separation distance. The energy-dependent performance of this apochromat was characterized at photon energies between 6.5 and 13.0 keV by ptychographic reconstruction of the focal spot and scanning transmission X-ray microscopy of a resolution test sample. The apochromat delivered a reconstructed focal spot size of 940 × 740 nm2. The apochromatic combination shows a four-fold improvement in the chromatic aberration correction range compared to an achromatic doublet configuration. Thus, apochromatic X-ray optics have the potential to increase the focal spot intensity for a wide variety of X-ray applications.

A new absorption-based method of X-ray microscopy using a nanofocusing refractive lens

A new method for studying the internal structure of micro-objects using synchrotron radiation based on the use of a planar nanofocusing compound refractive lens is proposed. The method registers the integral intensity of radiation after passing through the object. In this case, locality is ensured by focusing the beam into a line of nanometer width. Phase contrast is not used. The profile of object thickness inside the x-ray beam is obtained immediately. However, the two-dimensional structure of the object image is calculated using the specific tomography method. The method does not require complex mathematical calculations and gives a result with a very high accuracy. An experiment was simulated with a silicon carbide substrate for typical values of all parameters to illustrate the operation of the method.

A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument.

The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating.

A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

A new method is proposed for determining experimentally the size of a synchrotron radiation beam in the focus of planar compound refractive lenses. The method consists in measuring the angular divergence of radiation after the focus using Bragg diffraction in a perfect crystal during its rotation. This method determines the beam size, which depends only on the focusing properties of the lenses in use, in contrast to other currently applied methods. The efficiency of the proposed approach has been experimentally demonstrated using nanofocusing planar silicon lenses as an example.

Preliminary study on design and processing of diamond compound refractive lens

Preliminary study on design and processing of diamond compound refractive lens

Design optimization of one-dimensional aberration-free x-ray gradually focusing lenses

In our previous work, we proposed a new design method for an aberration-free x-ray refractive focusing lens based on an ideal Cartesian oval shape to solve the aberration problem in x-ray compound refractive focusing. In this paper, we propose an optimization method for this new lens. By reducing the aperture of each lens, we achieve the objective of increasing the effective aperture and improving the focusing performance of the lens. The simulation of the beam propagation method shows that the focusing performance of the optimized lenses is better in compound refractive lens shape but worse in the kinoform shape. This is different from the results obtained with the conventional kinoform lens. After further comparison, we found that this is because the step height of the kinoform lens is small when the lens aperture is very small, resulting in a strong diffraction effect that weakens the focusing performance of the lens. Further modifications to the structure of the kinoform lens are needed to improve this phenomenon.

Etched Silicon Planar CRL Optics for the High-Energy X-ray Diffraction Beamlines 11-ID-B and 11-ID-C at the APS

The focusing of high-energy X-rays is most commonly achieved by commercially available compound refractive lenses (CRL), which are added together in larger structures. There is a need for high-energy X-ray beamlines to enable focusing in only one dimension down to a few micrometers to study layered materials and thin films. High-energy X-rays above 50 keV require often 100 lenses or more, therefore it is more efficient to etch the complete arrays of lenses into a monolithic substrate like a silicon wafer. Custom lens arrays were fabricated for the high-energy x-ray beamlines 11-ID-B, and 11-ID-C at the Argonne National Laboratory. The fabrication required tuning parameters of the Bosch process to optimize the etching of deep vertical sidewalls at a reasonable speed without overheating. The beamline 11-ID-B is equipped with lens arrays of 85-110 lenses for 59 keV and 190-250 lenses for 87 keV photon energy, focusing the beam vertically below 5.0 µm at the sample positions between 1600 mm to 2100 mm. 11-ID-C has received arrays of 435 lenses that focus 106 keV X-rays to a vertical height of 2.0 µm at the sample position. In both cases, the flux density gain in the focal spot is larger than a factor of 20, relative to using slits to cut the beam size. The lens setup is permanently installed and can be moved in and out of the beam during the experiment without further alignment. The lenses have enabled operando diffraction studies on interfaces in batteries and the development of pair distribution function (PDF) analysis using grazing incidence geometry.

X-ray diffraction with micrometre spatial resolution for highly absorbing samples.

X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high-precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high-Z materials in a thin-film solar cell, are demonstrated. The proposed approach allows users from the materials-science community to determine micro-structural properties even in highly absorbing samples.

X-ray focusing to 62keV by compound refractive lenses for high-pressure x-ray diffraction.

This study describes high-energy x-ray focusing optics using compound refractive lenses (CRLs) for high-pressure x-ray diffraction (XRD) with a monochromatic x-ray beam. A CRL-based x-ray transfocator was upgraded and installed in the optics hutch at the BL10XU beamline of SPring-8. The instrument can be equipped with two types of CRLs in parallel: a newly designed aluminum (Al) CRL for x-ray energies of 40-62keV and an existing glassy carbon CRL for those up to 40keV. In only the Al-CRL-based x-ray transfocator, a 62keV monochromatic x-ray beam with horizontal (H) and vertical (V) focused spots, whose sizes were 189 and 10.5 µm, respectively, and a flux of 1.32 × 1011 phs/s were generated. A polymer SU-8 CRL fabricated via deep x-ray lithography was installed to further reduce the x-ray beam size. The Al-CRL and the SU-8 CRL were combined to generate a smaller spot size of 12.5 (H) × 11.0 (V) μm2 with a flux of 3 × 1010 phs/s at 62keV. A two-step optical configuration combining an x-ray transfocator and SU-8 CRL provides a valuable method for high-pressure XRD using a high-energy x-ray focused beam. The optical design and performance of the Al-CRL-based x-ray transfocator, its combination with the SU-8 CRL, and the first results of the focusing optics commissioning are presented here.

Operation of a versatile compound refractive lens (CRL) transfocator

Operation of a versatile compound refractive lens (CRL) transfocator

Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources

The compound refractive lens (CRL) is a commonly used X-ray optical component for photon beam conditioning and focusing on the beamlines of the X-ray facilities. The normal preparation materials are beryllium, aluminum, silicon of current lenses, and they all suffered from high heat load fatigue and short pulse damage risks. Hard materials based CRL is engaged attention for the advanced X-ray application. Sapphire crystal has the advantages of high density, high melting point, low thermal expansion coefficient. In this paper, properties of the refraction and absorption ratio of Sapphire and parameters of Sapphire lenses of effective aperture, transmittance, resolution, number of lenses needed for a certain focus, are taken into account for the CRL design, comparing with those of several common materials as well. The calculation results show that the performance of the sapphire lens is better than that of the aluminum lens and silicon lens, and inferior to that of the beryllium lens and diamond lens, but the number of lenses used is less. In the meantime, performances of sapphire lenses focusing are simulated and thermal effects on lenses are analyzed. Analysis and discussion are carried out under the same conditions as the metal Aluminum ones. The focusing simulation shows that the sapphire lenses can obtain a smaller spot with more intensity. The thermal analysis indicates that the temperature during use of the sapphire lens is much lower than the melting point of sapphire, and the thermal deformation is negligible.

An automated approach to the alignment of compound refractive lenses.

Compound refractive lenses (CRLs) are established X-ray focusing optics, and are used to focus the beam or image the sample in many beamlines at X-ray facilities. While CRLs are quite established, the stack of single lens elements affords a very small numerical aperture because of the thick lens profile, making them far more difficult to align than classical optical lenses that obey the thin-lens approximation. This means that the alignment must be very precise and is highly sensitive to changes to the incident beam, often requiring regular readjustments. Some groups circumvent the full realignment procedure by using engineering controls (e.g. mounting optics) that sacrifice some of the beam's focusing precision, i.e. spot size, or resolution. While these choices minimize setup time, there are clear disadvantages. This work presents a new automated approach to align CRLs using a simple alignment apparatus that is easy to adapt and install at different types of X-ray experiments or facilities. This approach builds on recent CRL modeling efforts, using an approach based on the Stochastic Nelder-Mead (SNM) simplex method. This method is outlined and its efficacy is demonstrated with numerical simulation that is tested in real experiments conducted at the Advanced Photon Source to confirm its performance with a synchrotron beam. This work provides an opportunity to automate key instrumentation at X-ray facilities.

Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III.

Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRA III, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X-ray beam to the sub-micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal-to-noise ratio by conditioning the beam shape profile at the focal spot. A new sample alignment system with a small sphere of confusion enables single-crystal data collection from grains of micrometer to sub-micrometer dimensions subjected to pressures as high as 200 GPa. The combination of the technical development of the optical path and the sample alignment system contributes to research and gives benefits on various levels, including rapid and accurate diffraction mapping of samples with sub-micrometer resolution at multimegabar pressures.

On the theory of synchrotron radiation nanofocusing with planar compound refractive lenses.

Two new methods of computer simulation of synchrotron radiation nanofocusing with planar compound refractive lenses (PCRLs) are presented. The methods are based on the results of analytical theory. In contrast to previous works, the new methods take into account the PCRL aperture. It is especially important at high photon energies, when absorption is low and the calculations based on analytical theory, i.e. without taking into account the aperture, give incorrect results. A computer program was created and specific results were obtained for a silicon PCRL having an aperture of 50 µm, element length of 102 µm and minimum thickness of 2 µm. For an energy of 50 keV and number of elements 300, it focuses the beam to 31 nm size at a distance of one and a half times its length. Analysis of the calculation accuracy for the proposed methods is performed, as well as a demonstration of the capabilities of the computer program.