In this paper, the structural study of NaYSnO4 (NYSO), a layered perovskite ceramic oxide, was done using an X-ray diffractometer (XRD) to identify the phase and determine the composition of NYSO. The microscopic structure of the sample seen by Scanning Electron Microscopy (SEM) was found to be polycrystalline and a mixture of large and small grains, which indicate the anisotropic nature of the sample. A FTIR spectroscopic behaviour of the material was used to identify the formation of different bonds in the material, and the XPS study gives an idea of the binding energy of each element in NYSO. A thorough analysis of the impedance, dielectric constant, dielectric loss, modulus and AC conductivity properties concerning temperature and frequency displays the electronic device characteristics. The complex impedance spectra were studied at temperatures range between 25 and 500˚C and frequency of 100 Hz to 1 MHz range. Nyquist plots reveal the charge conduction mechanism of the grain and well-defined grain boundaries that correspond to the resistive and capacitive phenomena of the material. Furthermore, the activation energy has been estimated to investigate the charge transportation mechanism. This article concludes by discussing future possibilities and scientific challenges in NTCR thermistors using NYSO.
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