We have used a microwave, non-contact, non-destructive, dielectric resonator (DR) technique to characterize complex conductivity of different quality YBCO/Hastelloy tapes for the purpose of exploring such a technique as a potential quality control method for fabrication of YBCO tapes. The tapes were deposited at different temperatures on Hastelloy-supported oxide buffer layers using the MOCVD technique. The buffer stack consisted of aluminum oxide (Al2O3), yttrium oxide (Y2O3), and textured ion beam assisted deposition-MgO and LaMnO3 layers. Two dielectric resonators (DRs), the single post DR, consisting of high-permittivity barium zirconium titanate ceramic operating at 13 GHz in quasi-TE01δ mode, and the rod DR, consisting of rutile single crystal disk operating at 9.4 GHz in-TE011 mode, were designed to meet sensitivity requirements for characterization of conductivity of the superconductor at normal and superconducting states, respectively. For calculations of complex conductivity from experimental data of Q-factor and resonant frequency shift, a commercial electromagnetic simulator HFSS, based on finite elements analysis, was used. The theoretical Q-factor and resonant frequency on conductivity functions obtained from full wave numerical simulations of microwave fields were matched with the experimental data to determine conductivity of the YBCO tapes in both normal and superconducting states. In addition, for comparison purposes, 280 nm thick high-quality YBCO epitaxial film deposited on a dielectric substrate was also characterized, including frequency dependence of the complex conductivity. Discussion about feasibility of using DR microwave techniques as a quality control tool via measurements of conductivity versus temperature slope of the YBCO/Hastelloy tape in normal state is included. Also, microwave conductivity values of Hastelloy substrate as a function of temperature are reported.
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