Cobalt Ferrite Films Research Articles

Co-ferrite--New magnetooptic recording material

Single-crystal thin films of cobalt-ferrite with large perpendicular anisotropy were grown on MgO substrates. The films are represented by the general formula Co <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</inf> Fe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3-x</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf> . The flux reversal mechanism, the main magnetic and magnetooptic parameters of these films were studied over the wide composition range. Bit-by-bit and holographic Curie point writing were made on cobalt-ferrite films. The films possess some unique advantages in comparison with MnBi films. Write energy and diffraction efficiency of cobalt-ferrite films were measured and calculated. The films are found to be suitable for magnetooptic memory applications.

Faraday rotation and birefringence of thin films of cobalt ferrite

Faraday rotation and birefringence of thin films of cobalt ferrite

Defects in epitaxial ferrite films grown by chemical vapour deposition

Thin single-crystal films of cobalt ferrite and lithium ferrite have been grown on magnesia. Cation stacking faults in these films have been studied by transmission electron microscopy and electron diffraction. These cation faults are found to lie on two families of planes, {110} and {310}. A comparison is made of the cation arrangements at these fault planes and it is shown that the {110} 1 4 [110] fault is the most likely fault to occur in the spinel structure.

On Faraday rotation and birefringence of thin films of cobalt ferrite

On Faraday rotation and birefringence of thin films of cobalt ferrite

Optical Constants of Sputtered Ferrite Films

Transmission and reflection spectra in the 250–50 000 cm−1 region have been obtained for nickel and cobalt ferrite films deposited by d.c. sputtering of the polycrystalline ferrites onto glass and fused-silica substrates. Both types of films exhibit an absorption edge at 14 000 cm−1.From interference effects in the films, dispersion curves have been obtained in the 4000–16 000 cm−1 range by a method which compensates for the absorption effects. In this region, the absorption coefficients were obtained from the dispersion curves and the transmission spectra. The results indicate that the films may be inhomogeneous. The refractive indices of nickel ferrite films 1000 and 23 600 Å thick are 2.7 and 2.1 respectively. A method for determining the optical constants from the reflectance and transmittance at higher frequencies was also investigated.