This paper describes a flow injection vapor generation (VG) method using inductively coupled plasma mass spectrometry (ICP-MS) for determining As, Cd, Sb, Hg, and Pb in nail polish. The samples for VG were prepared as aqueous slurries of a nail polish (0.5%m/v), thiourea (1%m/v), Co(II) (0.75μgmL−1), and HCl (1.2%v/v). Chemical VG of As, Cd, Sb, Hg, and Pb ions, by reduction with tetrahydroborate (3%m/v in 0.2%m/v NaOH), enabled their separation from the slurry. With VG sample introduction, As, Cd, Sb and Hg signals were increased by 1–2 orders (except Pb) compared to solution nebulization due to better sample introduction. Quantifications were performed by VG ICP-MS using isotope dilution and standard addition methods as slopes of calibration plots of analytes in the slurries were higher. Using the reported procedure, samples of three nail polishes purchased locally were analyzed for their levels of As, Cd, Sb, Hg, and Pb. The results obtained were in good agreement with those measured using electrothermal vaporization ICP-MS. In the original nail polish sample, the detection limits, calculated as 3σ of blank measurements, for As, Cd, Sb, Hg, and Pb, estimated from standard addition curves, were 0.06, 0.12, 0.14, 0.2, and 12ngg−1, respectively.