RG64 is a 64-channel ASIC designed for the silicon strip detector readout and optimized for high count rate X-ray imaging applications. In this paper we report on the test results referring to the RG64 noise level, channel uniformity and the operation with a high rate of input signals. The parameters of the RG64-based diffractometry system are compared with the ones based on the scintillation counter. Diffractometry measurement results with silicon strip detectors of different strip lengths and strip pitch are also presented.