This paper presents the design of a low-power programmable pseudorandom word generator (PRWG) and a low-noise clock multiplier unit (CMU) for high-speed SerDes applications. The PRWG is capable of producing test patterns with sequence length of 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">7</sup> -1, 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">10</sup> -1, 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">15</sup> -1, 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">23</sup> -1, and 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">31</sup> -1 b according to CCITT recommendations, and the random word is 16-bit wide. High-speed and low-power operations of the PRWG are achieved by parallel feedback techniques. The measured jitter of the CMU is only 3.56 ps <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">rms</sub> , and the data jitter at the PRWG output is mainly determined by the CMU. Implemented in an 0.18-mum CMOS process, the power dissipation for the PRWG is only 10.8 mW, and the CMU consumes about 87 mW from a 1.8-V supply. This PRWG can be used as a low-cost substitute for external parallel test pattern generators.
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