A study has been made with the view of applying carrier distillation techniques to the analysis of trace impurities in copper by emission spectroscopy. Of many materials investigated, the halides of copper and silver, particularly the fluorides and chlorides, appear to be promising spectroscopic carriers for this purpose. Detection limits have been measured for sixteen impurity elements in copper both with and without the halide carriers and sensitivity enhancement factors of up to twenty-fold are achieved. Sensitivities, using copper fluoride as the carrier, appear to be at least equivalent to, and in many cases an order of magnitude better than, those achieved in the sensitive globule arc method. There are indications that these carriers are equally effective for impurities in silver, gold and the platinum metals. The technique has been applied to the analysis of arsenic in copper with excellent results.
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