Capacitance Measurement Method Research Articles

1199. Investigation of the CdSe-SiO x system properties by the MIS structure capacitance measurement method : A Jakubowksi and P Jagodzinki, Elektronika, 12 (7), 1971, 261–267 ( in Polish)

1199. Investigation of the CdSe-SiO x system properties by the MIS structure capacitance measurement method : A Jakubowksi and P Jagodzinki, Elektronika, 12 (7), 1971, 261–267 ( in Polish)

Device for the Measurement of Acoustic Impedance in Air

The device described here basically measures the radiation impedance of a thin circular membrane. The membrane is excited by a push-pull electrostatic drive, and its velocity is determined by a carrier capacitance measurement method. The force applied divides between the air on both sides and the membrane itself. One side is terminated in a reflectionless chamber, and the unknown is presented to the other side. The ratio of potentials proportional to force and velocity give total impedance from which the unknown can be determined. When pressure is measured by a microphone, specific impedance is measured and compensation for the membrane and terminated side is not necessary. However, the separation of the membrane and microphone results in a phase error. The characteristics and limitations of the device are presented and some measurements given. Some application to room acoustics and sound-reproducing systems are suggested. [Supported in part by the Office of Naval Research.]

On the error associated with the MIS method of capacitance measurement of surface state density

The inherent error associated with the deduction of surface capacitance from measured MIS capacitance is considered. It is shown that the systematic component of the experimental error does not restrict the range of applications of the technique whereas any random contribution can invalidate the measurement in certain cases.