The Vickers microhardness of Xe-intercalated polycrystalline fullerite C60 (XexC60, x≃0.35) is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness of the material (by a factor of 2 to 3) as compared to that of pure C60 single crystals is observed. It is shown that the step-like anomaly in the temperature dependences of the microhardness of pure C60 single crystals recorded under the orientational fcc-sc phase transition (Tc≃260 K) is also qualitatively retained for XexC60, but its onset is shifted by 40 K towards lower temperatures and the step becomes less distinct and more smeared. This behavior of H̄V(T) correlates with x-ray diffraction data, the analysis of which revealed a considerable influence of xenon interstitial atoms on the peculiar features of fullerite thermal expansion due to orientational phase transitions (see the paper by A.I. Prokhvatilov et al. in this issue).