All-vapor-deposited perovskite solar cells (PSCs) offer promising potential for maintaining high efficiency across large-area solar modules. However, a comprehensive understanding of device stability, particularly the crucial photodegradation mechanism under sunlight exposure, remains scarce in the existing literature. In this study, we investigate thermally co-evaporated perovskite polycrystals grown on two typical organic hole-transporting layers (HTLs), macrocyclic copper (Ⅱ) phthalocyanine (CuPc) and the arylamine derivative of N4,N4,N4′,N4′-tetra([1,1′-biphenyl]-4-yl)-[1,1′:4′,1′-terphenyl]-4,4′-diamine (TaTm). Surprisingly, the robust CuPc limits the device performance with substantial non-radiative recombination loss and accelerates device degradation under light exposure. When built upon TaTm, the PSCs demonstrate a 47 times prolonged T80 lifetime (the efficiency drops to 80 % of the initial efficiency) of 1128 h by regulating the surface crystallography. By reducing the perovskite thickness to approach the buried heterojunction interface, we unravel the loss mechanism by directly observing crystallization dynamics. Our investigation reveals that surface polarity significantly influences the precursor adhesion, grain growth, and recombination dynamics at the HTL-perovskite interface. These findings underscore the critical role of the underlying surface in vapor-deposited PSCs, highlighting the potential for improved photostability through the regulation of interface imperfections.