Abstract— This paper is a preliminary report on the formation of ZnS thin films thicker than five monolayers using electrochemical atomic layer epitaxy (ECALE). Thin films were electrodeposited on Au‐coated Si wafers and ITO‐coated borosilicate glass slides. The deposits' morphology was examined by scanning electron microscopy and composition was determined by electron probe microanalysis. Grazing‐angle x‐ray diffraction showed cubic (111) ZnS films.