Bent Crystal Monochromator Research Articles

On the measurement of integrated intensities

The measurement of integrated intensities directly by conventional diffraction arrangements is not possible because the specimen crystals are normally smaller than the incident beam cross section. If a micro-source and a bent-crystal monochromator are used, however, the crystal can be made to intercept the entire incident beam and it is possible to measure the integrated intensity for all reflections. It is also shown how the necessary geometrical conditions for several arrangements can be satisfied.

A contribution to the semi-focusing method with a flat polycrystalline sample

Condition are derived for the approximate focusing of diffraction lines in the chosen, relatively wide angular region, using the semi-focusing method with a flat sample, if a bent crystal monochromator is employed. The form of the absorption factor for a flat polycrystalline sample is derived for the case of uniform oscillation of the sample in the angular region ± e around the axis of the camera.

Improved Monochromator for Diffuse X-Ray Scattering Measurements

A close approximation to a doubly bent crystal monochromator is obtained by pressing a large number of narrow strips in a doubly concave form. Details of construction are given. For measurements of diffuse scattering from a single crystal the monochromator gives 40 times the intensity of a singly bent crystal for the same volume element in reciprocal space.

Reflected Beam X-Ray Monochromator for Geiger Counter Diffractometry

A bent crystal monochromator, for Geiger counter diffractometry, was constructed to monochromate the specimen-reflected x-ray beam. This results in very low backgrounds, due to the elimination of fluorescent scattering from the specimen. Adequate resolution and diffracted energy were obtained.

X-Ray Measurement of Order in Single Crystals of Cu3Au

X-ray diffraction methods have been used to measure long- and short-range order parameters for single crystals of the alloy Cu3Au held at elevated temperatures. It is shown that short-range order parameters may be obtained by a three-dimensional Fourier analysis of the ``scattering power'' for the diffuse background scattering of x-rays, expressed as a function of reciprocal lattice coordinates. Appropriate experimental and computational procedures are outlined. Intensity measurements have been made with a special arrangement of a bent-crystal monochromator and a Geiger-counter spectrometer. Short-range parameters are given for the first ten shells of atoms surrounding a given atom for three temperatures above the critical temperature of Cu3Au. These results, and those for the long-range order parameter agree well with theoretical predictions.

An Accurate Method of Adjustment of Bent Crystal Monochromator Slits for X-ray Low Angle Scattering Studies

An Accurate Method of Adjustment of Bent Crystal Monochromator Slits for X-ray Low Angle Scattering Studies