The concept of a bending wavelength has been proposed in the description of strand deformation phenomena arising from electromagnetic loads, in cable-in-conduit conductor (CICC) with multistage twisted Nb3Sn cable, that result in the degradation of the CICC current sharing temperature (Tcs). A survey of CICC Tcs performance covering Nb3Sn CICC samples from the recent past two decades shows interesting results that can help relate bending wavelength to CICC parameters such as the void fraction (Vf) and the twist pitches of the CICC cable to which the latter has attributed to Tcs degradation according to prior research. In this paper, a simple cable strand model is used to link CICC parameters especially the CICC Vf to the bending wavelength of the CICC strand. Through this treatment, a range of bending wavelengths are identified that can be associated to characteristically different Tcs performance behaviour of the CICCs. The bending wavelength values corresponding to transitions between these characteristically different CICC Tcs behaviours are identified as critical bending wavelengths. Additionally, a picture of the internal mechanism resulting in Tcs change is presented along with comparisons of bending wavelength values derived from different theories and the value from destructive examination identified in the literature for Nb3Sn CICC samples.