The circular scan architecture (CSA) is a widely used scan design technique in digital circuit testing that involves scanning test data through a circuit in a circular pattern. Several optimization approaches have been suggested so far to lessen the Test Data Volume (TDV), but no one has shown satisfactory results. Therefore, this paper proposes a Modified and Customized Wingsuit Flying Search algorithm to decrease the test data volume time. The proposed MCWFS-SBA-CSA introduces some novel features that distinguish it from traditional circular scan approaches. The concept of wingsuit flying is an innovative approach in the field of scan systems. This allows the scan that moves more dynamically and efficiently, enabling it to cover a larger area in a shorter time than traditional circular-scan approaches. After this phase, only scan-chosen inputs are required to obtain the next test pattern from the captured response. Therefore, required less Automatic test equipment (ATE) memory in this research so there is a Decreased cost in system-on-chip (SOC). The proposed method attains fast global searching capacity. The efficiency of the proposed technique attains 26.42%, 32.45%, and 29.34% higher compression ratio (CR), Test Application Time (TAT) reduction of SC-128 attains 29.45%, 34.67%, and 40.22% higher, TDV of SC-256 attains 32.23%, 36.34%, and 39.23% higher than existing methods, such as TDV for Circular Scan Approaches utilizing Modified Shuffled Shepard Optimization (TDV-CSA-MSSO), Effectual Very-large-scale integration Test data compression system for CSA under modified and colony metaheuristic (ETDC-CSA-MACMH), and Test Data Compression Utilizing Tetrad state Skip System (TDC-DC-TSSC) for Digital Circuits, respectively.