Automatic Test Pattern Generation Research Articles

Automatic Test Pattern Generation for Robust Quantum Circuit Testing

Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This article alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques that can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by (1) theoretical guarantees under reasonable conditions and (2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV), and Bernstein-Vazirani (BV) in IBM Qiskit.

Test generation algorithm for QCA circuits targeting novel defects and its corresponding fault models

Considering the scaling limitations of current Complementary Metal Oxide Semiconductor (CMOS) technology, Quantum-dot-Cellular Automata (QCA) is emerging as one of the alternatives. QCA being at the molecular scale, defects are more likely to occur in it. Therefore, substantial development of QCA-oriented defects, its corresponding fault models and test generation is required. In this paper, a test generation algorithm for a QCA combinational circuit is proposed. The FAN (A Fanout Oriented) test generation algorithm is extended for QCA. The proposed Automatic Test Pattern Generator (ATPG) for QCA targets Single Stuck at Fault (SSF) set produced by novel Multiple Missing Cells (MMC) defects. The proposed ATPG is based on the QCA-oriented test generation properties and guided by proposed testability measures.The MCNC benchmark circuits are synthesized into QCA using proposed synthesis algorithms to check the effectiveness of the proposed ATPG. The ATPG is developed using C++ and tested on MCNC benchmark circuits. Further, ATPG-generated test vectors are validated at the QCA device level to demonstrate their correctness. The QCADesigner-E tool is used for the device-level implementation of the MCNC benchmark circuit.

Application of machine learning methods for automatic test pattern generation process optimization during circuit design

Application of machine learning methods for automatic test pattern generation process optimization during circuit design

A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing.

FSMx-Ultra: Finite State Machine Extraction From Gate-Level Netlist for Security Assessment

Numerous security vulnerability assessment techniques urge precise and fast finite state machines (FSMs) extraction from the design under evaluation. Sequential logic locking, watermark insertion, fault-injection assessment of a System-on-a-Chip (SoC) control flow, information leakage assessment, and reverse engineering at gate-level abstraction, to name a few, require precise FSM extraction from the synthesized netlist of the design. Unfortunately, no reliable solutions are currently available for fast and accurate extraction of FSMs from the highly unstructured gate-level netlist for effective security evaluation. The major challenge in developing such a solution is precise recognition of FSM state flip-flops in a netlist having a massive collection of flip-flops. In this paper, we propose FSMx-Ultra, a framework for extracting FSMs from extremely unstructured gate-level netlists. FSMx-Ultra utilizes state-of-the-art graph theory concepts and algorithms to distinguish FSM state registers from other registers and then constructs gate-level state transition graphs (STGs) for each identified FSM state register using automatic test pattern generation (ATPG) techniques. The results of our experiments on 14 open-source benchmark designs illustrate that FSMx-Ultra can recover all FSMs quickly and precisely from synthesized gate-level netlists of diverse complexity and size utilizing various state encoding schemes.

Self-Test Library Generation for In-Field Test of Path Delay Faults

New semiconductor technologies for advanced applications are more prone to defects and imperfections related, among several different causes, to the manufacturing process, aging and cross-talks. These phenomena negatively affect the circuit’s timing and can be effectively modeled by means of the path delay fault (PDF) model. While path delay testing is currently supported by commercial Automatic Test Pattern Generation tools for scan designs, functional testing covering PDFs is not widely adopted, mainly because of the high cost for test generation. On the other side, functional test is already widely adopted for in-field test of stuck-at faults, which is often performed resorting to the execution of suitable test programs (Self Test Libraries, or STLs). This approach is attractive, since it can be performed at-speed with limited time constraints and high flexibility, making it a suitable in-field test solutions. Previous work assessed the feasibility and validity of functional approaches based on test programs targeting PDFs. In this work, we present the first systematic method for the development of very high fault coverage test programs for PDFs, which largely outperform test programs written for other fault models. Moreover, the proposed method allows the identification of functionally untestable faults. The effectiveness of the proposed approach was proven on an open-source RISC-V processor core, where 100% coverage of the functionally testable longest paths was achieved, compared with an initial coverage of 0.52% achieved with test programs targeting stuck-at faults. Results demonstrate that shorter paths are also effectively covered.

ASIC Implementation for Multiple Scan at Register Transfer Level

Design for testability (DFT) is introduced to reduce the complexity of testing integrated circuit and help improve fault coverage. However, conventional DFT with additional 2-to-1 multiplexer (MUX) might add an increasing amount of delay and area overhead. Therefore, register transfer level (RTL) scan design is introduced to overcome this problem. This paper aims to present the development of an ASIC with RTL scan design by using multiple scan paths instead of the conventional technique, which is gate-level (GL) scan insertion to insert scan cells. This method inserts multiple scan cells by utilizing the existing multiplexer and operational units in order to reduce area overhead and delay. Besides, multiple scan paths are implemented instead of a single scan chain to reduce the complexity of the testing process, where a single scan chain has long test application times due to the high number of clock cycles for the scan chain process. RTL design is also modified by adding an extra gate for multiple scan chain insertion. The graph is derived in order to analyse the connection between registers such that the multiple scan paths can be determined accordingly. Synopsys tool is used for synthesized, placement and routing and performing automatic test pattern generation while static timing analysis is used to verify the results of the setup slack time for ASIC design. The simulation result shows that multiple scan paths insertion at RTL level has an area overhead and slack time of about 3.79% and 0.44ns less compared to multiple scan paths insertion at GL for a finite impulse response circuit with comparable high fault coverage and small delay. A comparison of the performance metrics such as area, setup slack time, and fault coverage of the multiple scan chain is done between the RTL scan and GL scan.

A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking

The need for reducing manufacturing defect escape in today's safety-critical applications requires increased fault coverage. However, generating a test set using commercial automatic test pattern generation (ATPG) tools that lead to zero-defect escape is still an open problem. It is challenging to detect all stuck-at faults to reach 100% fault coverage. In parallel, the hardware security community has been actively involved in developing solutions for logic locking to prevent IP piracy. In logic locking, locks are inserted in different locations of the netlist to modify the original functionality. Unless the correct key is programmed into the IC, the circuit functions incorrectly. Unfortunately, the Boolean satisfiability (SAT) based attack, introduced in [1], can determine the secret key efficiently, and break different logic locking schemes. In this paper, we propose a novel test pattern generation approach using the powerful SAT attack on logic locking. A stuck-at fault is modeled as a locked gate with a secret key, where it can effectively deduce the satisfiable assignment with reduced backtracks under key initialization of the SAT attack. The input pattern that determines the key is a test for the stuck-at fault. We propose two different approaches for test pattern generation. First, a single stuck-at fault is targeted, and a corresponding locked circuit with one key bit is created. This approach generates one test pattern per fault. Second, we consider a group of faults and convert the circuit to its locked version with multiple key bits. The inputs obtained from the SAT attack tool are the test set for detecting this group of faults. Our approach can find test patterns for all hard-to-detect faults that were previously undetected in commercial ATPG tools. The proposed test pattern generation approach can efficiently detect redundant faults as well. We demonstrate the effectiveness of the approach on ITC'99 benchmarks. The results show that we can detect all the hard-to-detect faults and identify redundant faults and a 100% stuck fault coverage is achieved. In addition, we show that test generation time saving becomes significant for Approach 2 as multiple faults help reduce or remove conflicts.

A New Static Compaction of Deterministic Test Sets

Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test application time, and hence the cost of testing. This article presents a method that strives to reduce the number of automatic test pattern generation (ATPG)-produced deterministic test patterns to deliver compact test sets. In principle, the new scheme works with a meaningful representation of test patterns by using external and internal necessary assignments (NAs) to determine small groups of potentially compatible faults. These faults are subsequently retargeted by the robust satisfiability (SAT)-based ATPG that produces a single test pattern for the entire group, thus making the resultant test set smaller in size. Experimental results obtained for 12 large industrial cores and stuck-at faults confirm superiority of the proposed scheme over the state-of-the-art test set compaction techniques and are reported herein.

Fault simulation for design for testability inserted designs

<p>Systematic design for testability (DFT) is a technique to enhance the testability of design so that it is further organized and self-regulating. The objective of systematic DFT is to enhance a circuit's operability and evidence. This can be performed in a variety of ways. The scan pattern method is the extremely predominant, and it modifies the design's internal sequential circuitry. In this manuscript, frequently used industry standard functional register-transfer level (RTL) designs are chosen. Structured DFT approach is adopted to do scan insertion and automatic test pattern generation (ATPG) to enhance the testability. Proposed methodology provides the controllability and observability for the clocks and reset used in chosen RTL designs by eliminating S rule and D rule violations by adding test logic. Also able to insert stuck at faults and achieve fault coverage of 97.78% and test coverage of 99.26% for DFT architecture for Wallace tree multiplier design, and found different classes of faults as testable and untestable faults and also performed fault simulation for the intended designs to detect fault from the created deterministic patterns.</p>

Early Detection of Clustered Trojan Attacks on Integrated Circuits Using Transition Delay Fault Model

The chances of detecting a malicious reliability attack induced by an offshore foundry are grim. The hardware Trojans affecting a circuit’s reliability do not tend to alter the circuit layout. These Trojans often manifest as an increased delay in certain parts of the circuit. These delay faults easily escape during the integrated circuits (IC) testing phase, hence are difficult to detect. If additional patterns to detect delay faults are generated during the test pattern generation stage, then reliability attacks can be detected early without any hardware overhead. This paper proposes a novel method to generate patterns that trigger Trojans without altering the circuit model. The generated patterns’ ability to diagnose clustered Trojans are also analyzed. The proposed method uses only single fault simulation to detect clustered Trojans, thereby reducing the computational complexity. Experimental results show that the proposed algorithm has a detection ratio of 99.99% when applied on ISCAS’89, ITC’99 and IWLS’05 benchmark circuits. Experiments on clustered Trojans indicate a 46% and 34% improvement in accuracy and resolution compared to a standard Automatic Test Pattern Generator (ATPG)Tool.

Design A Combinational Circuit Consists of 10 Logic Gates Using Quartos

Fault models are designed to forecast the expected behaviors (reaction) from the IC when faults are present, and this is what allows automated test pattern generation (ATPG) software to generate the test patterns. In order to identify these faults at every node in the circuit, the ATPG tool first consults the fault models to establish the patterns that will be necessary for doing so. In this article, ten logic gates are developed using the Quartos program to test for faults in a circuit, and the output waveform was simulated to determine the outcomes of the fault-free output using a variety of test patterns. This fault-free output is compared to the output when a fault injection occurs. It may then be determined if the various test patterns can be utilized to discover the fault in the simulation. The findings demonstrated that the fault can be discovered flawlessly.

BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature

This article presents a bounded model checking (BMC)-based temperature-aware software-based self-testing (SBST) technique to test worst case delay faults within the highest temperature range. The BMC-based SBST method first defines the sequential constraint. It develops a sequentially constrained automatic test pattern generation (ATPG) to ensure that the generated delay test patterns can emerge in functional mode. It then uses the processor’s multiple-level information to reduce the model complexity, avoid aborts due to time-outs during the BMC process, and generate test programs automatically. A temperature-aware SBST method has then been developed to ensure that the test temperature is within the specified range and test the worst case delays under high temperature. Experimental results demonstrate that the proposed technique achieves an extremely high coverage for delay faults and effectively avoids yield loss caused by the overtesting problem. Its test quality also outperforms that of the existing methods. The generated SBST programs are successful and efficient in testing worst case delay faults under high temperature.

Methodology of Generating Timing-Slack-Based Cell-Aware Tests

In order to reduce defect parts per million, cell-aware (CA) methodology was proposed to cover various types of intracell defects. In this article, we present a novel methodology for generating 2-time-frame (2tf) CA tests based on timing slack analysis. The proposed 2tf CA fault model, aware of timing slack and named TS, defines a fault: 1) on a cell instance basis and 2) based on per-instance timing criticality (according to timing slack). By comparing the derived extra delay against the timing slack of the cell instance, a delay fault can be defined, and according to its severity, the fault can be further classified into small-delay fault or gross-delay fault. In contrast to prior 2tf CA methodology that is on a cell (rather than cell instance) basis and unaware of timing criticality/slack, our methodology can identify “more realistic” faults which really need to be considered, and potentially the cost/effort for testing those 2tf CA faults can be reduced. We also propose a test quality metric, timing slack defect coverage (TSDC), to measure the effectiveness of automatic test pattern generation (ATPG) tests in terms of the ability to detect small-delay TS defects along long paths. Experimental results on a set of 22-nm industrial designs demonstrate that, due to more realistic fault identification, the number of identified small-delay faults can be reduced by 56.8%. With the slack-based ATPG for testing small-delay faults along long paths, TS can reduce the number of test patterns by 33.1% while achieving 0.49% higher TSDC, compared with the results of prior 2tf CA methodology.

A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits

As technology scales down, digital VLSI circuits are prone to many manufacturing defects. These defects may result in functional and delay-related circuit failures. The number of test escapes grows when technology is downscaled. Small delay defects (SDDs) and hidden delay defects (HDDs) are of critical importance in industries today since they are the source of most test escapes and reliability problems. Improving test quality and creating new test methods, algorithms, and test designs requires a comprehensive study of these delay defects. This article reviews the effect and impact of SDD and HDD in logic circuits. It also analyzes the relevant fault models, automatic test pattern generation (ATPG) methods, faster-than-at-speed testing (FAST), cell-aware (CA) based delay tests, test quality metrics, diagnosis of SDDs and HDDs, and commercially available Electronic Design Automation (EDA) tools. Based on the analysis, the benefits and drawbacks of several accessible approaches are addressed.

Test Methodology for Defect-Based Bridge Faults

A defect-based bridge fault represents the faulty behavior of an interconnect short defect obtained by SPICE simulating the two shorted cells with the short defect injected. In this article, we have developed a framework to automatically extract defect-based bridge faults and utilize commercial automatic test pattern generation (ATPG) to generate corresponding test patterns for a given design. A defect-based bridge fault model can not only describe the faulty behavior of a short defect precisely but also result in collapsible faults at one shorted cell pair. As a result, using a defect-based bridge fault model for ATPG can lead to a significantly smaller bridge-fault test set when compared with a conventional four-way dominance bridge fault model, where four noncollapsible faults at one shorted cell pair are considered for ATPG. In addition, some short defects can only be detected by the test set for defect-based bridge faults but not by the test set for four-way dominance bridge faults with more test patterns. The runtime required for extracting 1-time-frame (1tf) defect-based bridge faults has been proven acceptable on industrial designs and some techniques were also proposed to speed up the runtime for extracting 2tf defect-based bridge faults. All experiments in this article are conducted based on industrial designs.

Benchmarking Benchmarking

<bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">This special issue of</b> <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">IEEE Design&amp;Test</i> is about benchmarking machine learning (ML) applications. A special issue on benchmarking is long overdue. The last one I can find is one I edited way back in 2000. That issue covered the ITC99 benchmarks that I put together and introduced at a special session of the 1999 International Test Conference. These were used for comparing automatic test pattern-generation (ATPG) algorithms.

Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing.

To improve the test accuracy and fault coverage of high-speed railway-related equipment boards, a time-varying pseudorandom disturbance algorithm based on the automatic test pattern generation technology in chip testing is proposed. The algorithm combines the pseudorandom pattern generation algorithm with the deterministic pattern generation D algorithm. The existing pseudorandom number generation method usually requires random seeds to generate a series of pseudorandom numbers. In this algorithm, the system timer is used as the random seed to design a pseudorandom pattern generation method of time-varying seed to improve the randomness of pseudorandom pattern generation. In addition, in combination with the D algorithm, this work proposes a new switching logic between two algorithms by counting invalid pattern proportions. When the algorithm is applied to track a circuit netlist, the fault coverage can reach near 100%. However, the large-scale circuit fault coverage cannot easily reach 100%. The test results for the standard circuits of different sizes show that at the same time, compared with the independent pattern generation methods, the proposed algorithm can improve fault coverage by more than 50% and 30% and significantly improve the pattern generation efficiency. Therefore, it can be used perfectly in the subsequent construction of high-speed railway equipment test platforms.

Study, implementation and testing of radiation tolerant design for testability solutions for CMS OT FE ASICs

The MPA and SSA development is approaching the production phase with an approximate volume of more than 200k ASICs, corresponding to 1200 wafers. The limited manufacturing yield requires testing strategies able to identify defective units and guarantee the correct functionality of the tracker modules. This contribution presents innovative methods to replace the currently used functional tests for the digital part of the ASICs, showing limited testing accuracy and long testing time. The proposed solution exploits the concept of structural test and new testing algorithms such as Automatic Test Pattern Generation (ATPG) for general digital logic and March for memory elements. Design for Testability (DFT) hardware is integrated on chip to test SRAM memories, peripheral logic and MPA pixel array, providing internal control and observation points for the implementation of the those algorithms. Particular attention is given to power increase, timing and placement impact as well as radiation tolerance of the introduced circuitry, which must be fully transparent during the normal operation of the chip. A faster and more accurate testing approach is presented, from design methodology to implementation choices and silicon results, for a reliable and cost effective testing procedure.

A Timing Fault Model and an Efficient Timing Fault Simulation Method for Rapid Single-Flux-Quantum Logic Circuits

We examine digital behavior of faults caused by a change of the order of the pulse arrivals in Rapid Single-Flux-Quantum (RSFQ) logic circuits. Based on the timing fault model, we present a flow of automatic test pattern generation for testing digital RSFQ chips. As the test pattern generation repeatedly executes fault simulation, the scalability depends on computational cost of the simulation. We propose an efficient fault simulation method based on two ideas. First, we share computation for the fault-free circuit and faulty circuits as much as possible. Secondly, we exploit the pipelined behavior of RSFQ logic circuits to suppress computation for unnecessary signals. We have implemented our simulation method and obtained evaluation results to show that our method is effective for large circuits.