Surface and Interface AnalysisVolume 44, Issue 11-12 p. 1385-1385 Preface 5th Congress of the International Union of Microbeam Analysis Societies in conjunction with the 8th International Symposium on Atomic Level Characterization for New Materials and Devices' 11 Gyeung-Ho Kim, Corresponding Author Gyeung-Ho Kim Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, KoreaAdvanced Analysis Center, Korea Institute of Science and Technology, Seoul KoreaSearch for more papers by this authorJon-Do Yun, Jon-Do Yun Department of Nano Science and Engineering, Kyungnam University, Masan, KoreaSearch for more papers by this authorSe-Ahn Song, Se-Ahn Song Computational and Analytical Science Center, Samsung Advanced Institute of Technology, Suwon, KoreaSearch for more papers by this author Gyeung-Ho Kim, Corresponding Author Gyeung-Ho Kim Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, KoreaAdvanced Analysis Center, Korea Institute of Science and Technology, Seoul KoreaSearch for more papers by this authorJon-Do Yun, Jon-Do Yun Department of Nano Science and Engineering, Kyungnam University, Masan, KoreaSearch for more papers by this authorSe-Ahn Song, Se-Ahn Song Computational and Analytical Science Center, Samsung Advanced Institute of Technology, Suwon, KoreaSearch for more papers by this author First published: 07 September 2012 https://doi.org/10.1002/sia.5166Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article. Volume44, Issue11-12Special Issue: 5th Congress of the International Union of Microbeam Analysis Societies in conjunction with the 8th International Symposium on Atomic Level Characterization for New Materials and Devices' 11November-December 2012Pages 1385-1385 RelatedInformation
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