Application Of Electron Backscatter Diffraction Research Articles

The application of EBSD to the study of substructural development in a cold rolled single-phase aluminium alloy

Scanning electron microscopy and high resolution electron backscatter diffraction (EBSD) have been used to study substructural development during cold rolling of a single-phase Al–0.1 Mg alloy, the use of EBSD enabling more detailed quantitative measurements to be made than are possible with the transmission electron microscope (TEM). At low strains, bands of elongated cells, aligned at approximately 35° to rolling direction are formed. As the applied strain was increased, intersecting thinner and more widely spaced bands form within many grains, flow becomes localised within these new bands and they develop into microshear bands, which shear the original elongated cell structures. The changes in the scale of the microstructural features, the development of misorientations of the various types of low angle boundary and the alignment of the features to the rolling plane have been measured as a function of strain. The results are compared with previous TEM investigations of deformed aluminium, and a qualitative model of the microstructural evolution is proposed.

Application of electron backscatter diffraction to bulk high-Tc superconductors

We have successfully obtained electron backscatter diffraction (EBSD) Kikuchi patterns on various bulk high-Tc superconductors (polycrystalline KClO3-doped and undoped YBa2Cu3O7−δ (YBCO), single crystalline YBCO and NdBa2Cu3O7−y) and on YBCO and NdBCO thin films. We have established a sample polishing procedure to obtain intense Kikuchi patterns without an additional carbon coating of the ceramic superconductors. We present Kikuchi patterns, pole figures and orientation maps of the samples. On the polycrystalline KClO3-doped YBCO samples we find two major orientations (001) and (100) normal to the sample surface, while the undoped sample does not exhibit any orientation maxima, which is ascribed to the effect of a liquid phase due to the KClO3-additive during the preparation process. Furthermore, we discuss the future possibilities for the application of the EBSD technique for growing larger, bulk melt-textured samples for applications.

Application of electron backscatter diffraction (EBSD) to fracture studies of ferritic steels.

The application of electron backscatter diffraction (EBSD) to fracture studies has provided a new method for investigating the crystallography of fracture surfaces. The crystallographic indices of cleavage planes can be measured both directly from the fracture surface and indirectly from metallographic sections perpendicular to the plane of the adjoining fracture surfaces. The results of direct individual cleavage facet plane orientation measurements are presented for carbon-manganese (C-Mn) and low-alloy Mn-Mo-Ni (similar to ASTM A553 type-B). Pressure vessel steel weld metals, obtained from fracture surfaces of Charpy impact test specimens fractured at various test temperatures and for an ultra-low carbon steel (Fe-0.002C- 0.058P) fractured at -196 degrees C by impact. In addition to the direct measurement from the fracture surface, cleavage facet orientation measurements for the ultra-low carbon steel were complemented by the results obtained from the metallographic sections. Fractographic observations revealed that cleavage fracture is accommodated by a microvoid coalescence fracture micromechanism, which was induced by decohesion of second phase particles (inclusions). The correlation between the direct and indirect methodologies shows that the cleavage facet planes are dominated by the [001] plane orientations, and indicated that even when information concerning the full five degrees of freedom is inaccessible, the cleavage facet plane could still be determined. Finally, the advantages and disadvantages of direct orientation measurements from the fracture surface and indirectly by a destructive sectioning technique are discussed.

Combined application of electron backscatter diffraction and stereo-photogrammetry in fractography studies.

The main aim of this paper is to report on recent experimental developments that have succeeded in combining electron back-scatter diffraction (EBSD) with stereo-photogrammetry, compared with two other methods for study of fracture surfaces, namely visual fractography analysis in the scanning electron microscope (SEM) and EBSD directly from facets. These approaches will be illustrated with data relating to the cleavage plane orientation analysis in a ferritic and C-Mn steel. It is demonstrated that the combined use of EBSD and stereo-photogrammetry represents a significant advance in the methodology for facet crystallography analysis. The results of point counting from fractograph characterization determined that the proportions of intergranular fracture in C-Mn and ferritic steels were 10.4% and 9.4%, respectively. The crystallographic orientation was determined directly from the fracture surface of a ferritic steel sample and produced an orientation distribution with a clear trend towards the [001] plane. A stereo-photogrammetry technique was validated using the known geometry of a Vickers hardness indent. The technique was then successfully employed to measure the macroscopic orientation of individual cleavage facets in the same reference frame as the EBSD measurements. Correlating the results of these measurements indicated that the actual crystallographic orientation of every cleavage facet identified in the steel specimens is [001].

Application of electron back-scatter diffraction to grain boundary surfaces

Application of electron back-scatter diffraction to grain boundary surfaces

The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

In a scanning electron microscope (SEM) an electron beam sets up an omni-directional source of scattered electrons within a specimen. Diffraction of these electrons will occur simultaneously on all lattice planes in the sample and the backscattered electrons (BSE), which escape from the specimen, will form a diffraction pattern that can be imaged on a phosphor screen. This is the basis of electron backscatter diffraction (EBSD). Similar diffraction effects cause individual grains of different orientations to give different total BSE. SEM images that exploit this effect will show orientation contrast (OC). EBSD and OC imaging are SEM-based crystallographic tools. EBSD enables measurement of the crystallographic orientation of individual rock-forming minerals as small as 1 μm, and the calculation of misorientation axes and angles between any two data points. OC images enable mapping of all misorientation boundaries in a specimen and thus provide a location map for EBSD analyses. EBSD coupled to OC imaging in the SEM enables complete specimen microtextures and mesotextures to be determined. EBSD and OC imaging can be applied to any mineral at a range of scales and enable us to expand the microstructural approach, so successful in studies of quartz rocks, for example, to the full range of rock-forming minerals. Automated EBSD analysis of rocks remains problematic, although continuing technical developments are enabling progress in this area. EBSD and OC are important new tools for petrologists and petrographers. Present and future applications of EBSD and OC imaging include phase identification, studying deformation mechanisms, constraining dislocation slip systems, empirical quantification of microstructures, studying metamorphic processes, studying magmatic processes, and constraining geochemical microsampling. In all these cases, quantitative crystallographic orientation data enable more rigorous testing of models to explain observed microstructures.

Crystallographic analysis of facets using electron backscatter diffraction.

Applications of electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction in the scanning electron microscope (SEM) are first and foremost microtexture and grain boundary misorientation analysis on a single polished section in the specimen. A more subtle and revealing approach to analysis of these data is to use EBSD to probe the orientations of planar surfaces, i.e. facets, which bound crystals. These surfaces include: * grain or phase boundaries * fractures * cracks It is of great interest to know the crystallography of such facets since it provides a key to understanding the physical properties of them. As far as investigation methodology is concerned, surfaces or facets associated with polycrystals are of two types: exposed or unexposed. Exposed facets, such as a fracture surface, can be viewed directly in the SEM, whereas unexposed facets, such as a grain boundary, are usually revealed as an etched trace on a polished surface. Photogrammetric methods can be used to obtain the positional orientation of an exposed facet, and the crystallographic orientation is obtained either directly from the surface or by indirect sectioning. Calibrated sectioning is required to obtain the equivalent parameters for an internal surface. The present paper compares the methods for obtaining and interpreting the crystallography of facets, with illustrations from several materials.

Quantitative metallography by electron backscattered diffraction.

Although electron backscattered diffraction (EBSD) in the scanning electron microscope is used mainly to investigate the relationship between local textures and microstructures, the technique has now developed to the stage where it requires serious consideration as a tool for routine quantitative characterization of microstructures. This paper examines the application of EBSD to the characterization of phase distributions, grain and subgrain structures and also textures. Comparisons are made with the standard methods of quantitative metallography and it is shown that in many cases EBSD can produce more accurate and detailed measurements than the standard methods and that the data may sometimes be obtained more rapidly. The factors which currently limit the use of EBSD for quantitative microstructural characterization, including the speed of data acquisition and the angular and spatial resolutions, are discussed, and future developments are considered.

Phase Identification Using EBSD in the SEM: What Can be Done Today and What we Hope to do Tomorrow

Phase identification using electron backscatter diffraction (EBSD) in the SEM has become a useful and important tool for the characterization of crystalline materials. Phase identification is accomplished using EBSD in the following manner. First, a high quality camera must be added to the SEM. Suitable cameras use slow scan CCD imagers coupled either by a lens or a fiber optic bundle to a phosphor screen that is situated near the sample. A EBSD pattern is collected and EDS or WDS is used to determine qualitatively the chemistry of the area. An automated routine is then used to extract the positions and widths of the lines in the pattern followed by a calculation of the unit cell volume. This information coupled with the chemistry of the sample is then used to search a database of crystal structures. Currently, the ICDD's Powder Diffraction file of over 100,000 compounds is used. Once a list of potential matches is found the patterns are indexed and then simulated to demonstrate that the phase has been identified. This paper will demonstrate use of EBSD for phase identification and then will speculate on future developments.A particularly nice application of EBSD is the use of the technique for the identification of phases that form in welds. Figure 1a is an EBSD pattern obtained from a acicular phase in a superalloy weld. The phase was determined to be primarily Ti and Ni. Analysis of the patterns showed that the phase is Ni3Ti. Figure 1b shows the simulation for Ni3Ti overlaid on the experimental pattern demonstrating that the phase has been identified.

Application of electron back-scattered diffraction to habit planes in plates

Application of electron back-scattered diffraction to habit planes in plates

Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction

Applications of electron back-scatter diffraction (EBSD) in the scanning electron microscope (SEM) are first and foremost microtexture and grain boundary misorientation analysis on a single polished section in the specimen. A more subtle and revealing approach to analysis of these data is to use EBSD to probe the orientations of planar surfaces, i.e. facets, which bound crystals. These surfaces include . grain or phase boundaries . fractures . cracks. It is of great interest to know the crystallography of such facets since it provides a key to understanding the physical properties of them. As far as investigation methodology is concerned, surfaces or facets associated with polycrystals are of two types: exposed or unexposed. Exposed facets, such as a fracture surface, can be viewed directly in the SEM whereas unexposed facets, such as a grain boundary, are usually revealed as an etched trace on a polished surface. Photogrammetric methods can be used to obtain the positional orientation of an exposed facet, and the crystallographic orientation is obtained either directly from the surface or by indirect sectioning. Calibrated sectioning is required to obtain the equivalent parameters for an internal surface. The present paper compares the methods for obtaining and interpreting the crystallography of facets. Recent data from copper and pure iron is presented and appraised.

Application of electron backscatter diffraction to orientation measurements of individual carbides in a white cast iron

Application of electron backscatter diffraction to orientation measurements of individual carbides in a white cast iron