Anthracene crystals were grown by solution growth technique by adopting slow evaporation method from the solvents CS2, CCl4 and CHCl3. The induction period was measured at various super saturations, and hence the interfacial energies were evaluated. Using the interfacial tension value, the nucleation parameters such as radius of the critical nuclei (r*), the Gibbs free energy change for the formation of a critical nucleus (∆G*) and the number of molecules in the critical nucleus (i*) were also calculated for all these solvents at two different temperatures. The effect of surface tension, viscosity and density of these solvents are correlated with interfacial tension. The solution grown crystals were subjected to UV, FTIR, NMR and X-ray diffraction studies. The purity and high-thermal stability of the grown crystals were determined using thermal analysis.