Mathematical formulae of angle-dependent integral XPS intensities based on simple geometrical models of metal particles grown upon a suitable substrate were derived. Measured diameters of silver particles deposited on a-C substrate were substituted into these formulae and XPS intensities calculated. The morphological data were obtained from TEM micrographs and measured by image analyzer. Calculated angle-dependent intensities were then compared with the measured ones. The differences between calculated and measured data are explained by a combined influence of several factors: invisibility of a certain amount of the deposited material in TEM, deviations from the hemispherical particle shape, and surface roughness of the substrate.